74LVC2G66

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© NXP B.V. 2013. All rights reserved.

Product data sheet

Rev. 8 — 2 April 2013

12 of 26

NXP Semiconductors

74LVC2G66

Bilateral switch

Test data is given in Table 11.

Definitions for test circuit:

RL = Load resistance.

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

VEXT = Test voltage for switching times.

Fig 19. Test circuit for measuring switching times

VEXT

VCC

VI

VO

001aae235

DUT

CL

RT

RL

RL

PULSE

GENERATOR

VM

VM

tW

tW

10 %

90 %

0 V

VI

VI

negative

pulse

positive

pulse

0 V

VM

VM

90 %

10 %

tf

tr

tr

tf

Table 11.

Test data

Supply voltage

Input

Load

VEXT

VCC

VI

tr, tf

CL

RL

tPLH, tPHL

tPZH, tPHZ

tPZL, tPLZ

1.65 V to 1.95 V

VCC

 2.0ns

30pF

1k



open

GND

2

 V

CC

2.3 V to 2.7 V

VCC

 2.0ns

30pF

500



open

GND

2

 V

CC

2.7 V

2.7 V

 2.5ns

50pF

500



open

GND

6 V

3.0 V to 3.6 V

2.7 V

 2.5ns

50pF

500



open

GND

6 V

4.5 V to 5.5 V

VCC

 2.5ns

50pF

500



open

GND

2

 V

CC