74LVC2G66

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© NXP B.V. 2013. All rights reserved.

Product data sheet

Rev. 8 — 2 April 2013

15 of 26

NXP Semiconductors

74LVC2G66

Bilateral switch

11.3 Test circuits

Test conditions:

VCC = 1.65 V: Vi = 1.4 V (p-p).

VCC = 2.3 V: Vi = 2 V (p-p).

VCC = 3 V: Vi = 2.5 V (p-p).

VCC = 4.5 V: Vi = 4 V (p-p).

Fig 20. Test circuit for measuring total harmonic distortion

001aag492

VIH

VO

VCC

0.5VCC

nZ/nY

nY/nZ

nE

600

Ω

fi

RL

10

μF

CL

D

Adjust fi voltage to obtain 0 dBm level at output. Increase fi frequency until dB meter reads 3dB.

Fig 21. Test circuit for measuring the frequency response when switch is in ON-state

001aag491

VIH

VO

VCC

0.5VCC

nZ/nY

nY/nZ

nE

50

Ω

fi

RL

0.1

μF

CL

dB

Adjust fi voltage to obtain 0 dBm level at input.

Fig 22. Test circuit for measuring isolation (OFF-state)

001aag493

VIL

VO

VCC

0.5VCC

nZ/nY

nY/nZ

nE

50

Ω

fi

RL

0.5VCC

RL

0.1

μF

CL dB