CY74FCT16501ATPVC datasheet(3/8 Pages) TI

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CY74FCT16501T

CY74FCT162501T

CY74FCT162H501T

Electrical Characteristics Over the Operating Range

Parameter

Description

Test Conditions

Min.

Typ.[8]

Max.

Unit

VIH

Input HIGH Voltage

2.0

VIL

Input LOW Voltage

0.8

Input Hysteresis[9]

100

VIK

Input Clamp Diode Voltage

VCC=Min., IIN=−18 mA

−0.7

−1.2

IIH

Input HIGH Current

Standard

VCC=Max., VI=VCC

±1

µA

Bus Hold

±100

IIL

Input LOW Current

Standard

VCC=Max., VI=GND

±1

µA

Bus Hold

±100

µA

IBBH

IBBL

Bus Hold Sustain Current on Bus Hold Input[10]

VCC=Min.,

VI=2.0V

−50

µA

VI=0.8V

+50

µA

IBHHO

IBHLO

Bus Hold Overdrive Current on Bus Hold In-

put[10]

VCC=Max., VI=1.5V

TBD

IOZH

High Impedance Output Current

(Three-State Output pins)

VCC=Max., VOUT=2.7V

±1

µA

IOZL

High Impedance Output Current

(Three-State Output pins)

VCC=Max., VOUT=0.5V

±1

µA

IOS

Short Circuit Current[11]

VCC=Max., VOUT=GND

−80

−140

−200

Output Drive Current[11]

VCC=Max., VOUT=2.5V

−50

−180

IOFF

Power-Off Disable

VCC=0V, VOUT≤4.5V

[12]

±1

µA

Output Drive Characteristics for CY74FCT16501T

Parameter

Description

Test Conditions

Min.

Typ.[8]

Max.

Unit

VOH

Output HIGH Voltage

VCC=Min., IOH=−3 mA

2.5

3.5

VCC=Min., IOH=−15 mA

2.4

3.5

VCC=Min., IOH=−32 mA

2.0

3.0

VOL

Output LOW Voltage

VCC=Min., IOL=64 mA

0.2

0.55

Output Drive Characteristics for CY74FCT162501T, CY74FCT162H501T

Parameter

Description

Test Conditions

Min.

Typ.[8]

Max.

Unit

IODL

Output LOW Current[11]

VCC=5V, VIN=VIH or VIL, VOUT=1.5V

115

150

IODH

Output HIGH Current[11]

VCC=5V, VIN=VIH or VIL, VOUT=1.5V

−60

−115

−150

VOH

Output HIGH Voltage

VCC=Min., IOH=−24 mA

2.4

3.3

VOL

Output LOW Voltage

VCC=Min., IOL=24 mA

0.3

0.55

Notes:

Typical values are at VCC= 5.0V, TA= +25˚C ambient.

This parameter is speciﬁed but not tested.

10. Pins with bus hold are described in Pin Description.

11. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reﬂect operational values. Otherwise prolonged shorting of

a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter

tests, IOS tests should be performed last.

12. Tested at +25˚C.

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