TS2DDR2811 datasheet(7/13 Pages) TI

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(see Note A)

TEST CIRCUIT

2 × VCC

Open

GND

VOH

VOL

VOLTAGE WAVEFORMS

OUTPUT SKEW (tsk(o))

Data Out at

YB1 or YB 2

50 Ω

VG1

VCC

DUT

50 Ω

VSEL

50 Ω

VG2

50 Ω

TEST

3.3 V ± 0.3 V

VCC

Vin

tsk(p)

tsk(o)

3.3 V ± 0.3 V

Open

200 Ω

VCC or GND

10 pF

Input Generator

(VOH + VOL)/2

VOH

VOL

Data Out at

XB1 or XB 2

(VOH + VOL)/2

3.5 V

1.5 V

Data In at

Ax or A y

2.5 V

tPLHx

tPHLx

tsk(o)

tPLHy

tPHLy

tsk(o) = tPLHy - t PLHx or tPHLy - t PHLx

VOH

VOL

VOLTAGE WAVEFORMS

PULSE SKEW [t sk(p)]

Output

(VOH + VOL)/2

Input

2.5 V

tPLH

tPHL

tsk(p) = tPHL - t PLH

3.5 V

1.5 V

TS2DDR2811

www.ti.com

SCDS294 – DECEMBER 2009

PARAMETER MEASUREMENT INFORMATION

(Skew)

CL includes probe and jig capacitance.

Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output

control. Waveform 2is for an output with internal conditions such that the output is high, except when disabled by the

output control.

All input pulses are supplied by generators having the following characteristics: PRR

≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5

ns, tf ≤ 2.5 ns.

The outputs are measured one at a time, with one transition per measurement.

Figure 6. Test Circuit and Voltage Waveforms

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