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W2635A Datasheet(PDF) 1 Page - Agilent(Hewlett-Packard) |
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W2635A Datasheet(HTML) 1 Page - Agilent(Hewlett-Packard) |
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1 / 11 page  The Agilent Technologies' W2635A and W2636A DDR3 BGA probe adapters provide signal access to the clock, strobe, data, address and command signals of the DDR3 BGA package for making electrical and timing measurements with an Infiniium oscilloscope. The DDR3 JEDEC1 specification (JESD79-3C) is defined at the DRAM ballout, and the ballout is difficult to access. The BGA probe adapter provides direct signal access to the BGA package for true compliance testing. The W2635A and W2636A DDR3 BGA probe adapters are soldered in between the DRAM and PC board or DIMM raw card where the DRAM would normally be soldered. They are designed with the PCB or DIMM footprint on the bottom side and the DRAM footprint on the top side. The BGA adapter passes the signals from the memory controller chip and DRAM directly to the top side of the BGA probe adapter where they can be accessed with oscilloscope probes. Buried resistors placed at the signals inside the BGA probe adapter connect the probed signals to solder pads designed to work with Agilent InfiniiMax E2677A, N5381A, N5425A, and N5426A differential solder-in probe heads. These resistors isolate the DDR3 signal and the probe loading effect. This design minimizes capacitive loading of the probe heads and allows high-speed operation without impact on signal integrity. Probing at the right location is also an important consideration for DDR3 measurement. Many designs have vias or designed-in probe points, but they do not always produce good signal integrity. Probing at the wrong W2635A and W2636A DDR3 BGA Probe Adapter for Infiniium Oscilloscopes Data Sheet Superior probing for DDR3 compliance test and debug location could cause signal reflection, resulting in non-monotonic edges. This will cause error in your tests such as slew rate, setup and hold time measurements. When used with Agilent's U7231A DDR3 compliance test application, the BGA adapter provides a fast and easy way to test, debug and characterize your DDR3 designs. The tests covered by the U7231A software are based on the JEDEC (JESD79-3C) DDR3 SDRAM Specification. The test application offers a user-friendly setup wizard and a comprehensive report that includes margin analysis. 1 The JEDEC (Joint Electronic Device Engineering Council) Solid State Technology Association is a semiconductor engineering standardization body of the Electronic Industries Alliance (EIA), a trade association that represents all areas of the electronic industry. |
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