DAC5682Z datasheet(18/59 Pages) TI

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TEST METHODOLOGY

DAC-A

DAC-B

100

opt.

PLL

Loop

Filter

DLL

DAC5682ZDAC

CDCM7005

DCLK

SYNC

D15

Agilent 81205A

ParBERT

Pattern

Memory

100

Opt.

Clock

Divider

DAC5682ZEVM

DAC5682ZEVMSMAAdapterBoard

100

3.3 V

Agilent 8133A

PulseGenerator

Optional

Divider

HP8665B

Synthesized

Signal

Generator

Rohde &

Schwartz

FSU

Spectrum

Analyzer

36 each

SMA-SMAcables

SwapCable

ForDAC-B

measurements

DEFINITION OF SPECIFICATIONS

DAC5682Z

SLLS853C – AUGUST 2007 – REVISED JUNE 2009 ........................................................................................................................................................ www.ti.com

Typical AC specifications were characterized with the DAC5682ZEVM using the test configuration shown in

Figure 25. A sinusoidal master clock frequency is generated by an HP8665B signal generator and into a splitter.

One output drives an Agilent 8133A pulse generator, and the other drives the CDCM7005 clock driver. The

8133A converts the sinusoidal frequency into a square wave output clock and drives an Agilent ParBERT

81250A pattern-generator clock. On the EVM, the DAC5682Z CLKIN/C input clock is driven by an CDCM7005

clock distribution chip that is configured to simply buffer the external 8665B clock or divide it down for PLL test

configurations.

The DAC5682Z output is characterized with a Rohde and Schwarz FSU spectrum analyzer. For WCDMA signal

characterization, it is important to use a spectrum analyzer with high IP3 and noise subtraction capability so that

the spectrum analyzer does not limit the ACPR measurement. For all specifications, both DACA and DACB are

measured and the lowest value used as the specification.

Figure 25. DAC5682Z Test Configuration for Normal Clock Mode

Adjacent Carrier Leakage Ratio (ACLR): Defined for a 3.84Mcps 3GPP W-CDMA input signal measured in a

3.84MHz bandwidth at a 5MHz offset from the carrier with a 12dB peak-to-average ratio.

Analog and Digital Power Supply Rejection Ratio (APSSR, DPSSR): Defined as the percentage error in the

ratio of the delta IOUT and delta supply voltage normalized with respect to the ideal IOUT current.

Differential Nonlinearity (DNL): Defined as the variation in analog output associated with an ideal 1 LSB

change in the digital input code.

Gain Drift: Defined as the maximum change in gain, in terms of ppm of full-scale range (FSR) per °C, from the

value at ambient (25°C) to values over the full operating temperature range.

Gain Error: Defined as the percentage error (in FSR%) for the ratio between the measured full-scale output

current and the ideal full-scale output current.

Integral Nonlinearity (INL): Defined as the maximum deviation of the actual analog output from the ideal output,

determined by a straight line drawn from zero scale to full scale.

Intermodulation Distortion (IMD3, IMD): The two-tone IMD3 or four-tone IMD is defined as the ratio (in dBc) of

the worst 3rd-order (or higher) intermodulation distortion product to either fundamental output tone.

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