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33874 Datasheet(PDF) 11 Page - Freescale Semiconductor, Inc

Part # 33874
Description  Quad High Side Switch
PDF  38 Pages
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Manufacturer  FREESCALE [Freescale Semiconductor, Inc]
Direct Link  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

33874 Datasheet(HTML) 11 Page - Freescale Semiconductor, Inc

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Analog Integrated Circuit Device Data
Freescale Semiconductor
11
33874
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
POWER OUTPUT TIMING (HS0, HS1, HS2, HS3) (continued)
Over-current High Detection Blanking Time
tOCH
1.0
5.0
20
μs
CS
to CSNS Valid Time(24)
tCNSVAL
–
–
10
μs
Watchdog Timeout(25)
WD[1:0] : 00
WD[1:0] : 01
WD[1:0] : 10
WD[1:0] : 11
tWDTO0
tWDTO1
tWDTO2
tWDTO3
446
223
1800
900
558
279
2250
1125
725
363
2925
1463
ms
Direct Input Switching Frequency (DICR D3 = 0)
fPWM
-
300
-
Hz
SPI INTERFACE CHARACTERISTICS (RST, CS, SCLK, SI, SO)
Maximum Frequency of SPI Operation
fSPI
–
–
3.0
MHz
Required Low-state Duration for RST(26)
tWRST
–
50
350
ns
Rising Edge of CS to Falling Edge of CS (Required Setup Time)(27)
tCS
–
–
300
ns
Rising Edge of RST to Falling Edge of CS (Required Setup Time)(27)
tENBL
–
–
5.0
μs
Falling Edge of CS to Rising Edge of SCLK (Required Setup Time)(27)
tLEAD
–
50
167
ns
Required High-state Duration of SCLK (Required Setup Time)(27)
tWSCLKh
–
–
167
ns
Required Low-state Duration of SCLK (Required Setup Time)(27)
tWSCLKl
–
–
167
ns
Falling Edge of SCLK to Rising Edge of CS (Required Setup Time)(27)
tLAG
–
50
167
ns
SI to Falling Edge of SCLK (Required Setup Time)(28)
tSI(SU)
–
25
83
ns
Falling Edge of SCLK to SI (Required Setup Time)(28)
tSI(HOLD)
–
25
83
ns
SO Rise Time
CL = 200pF
tRSO
–
25
50
ns
SO Fall Time
CL = 200pF
tFSO
–
25
50
ns
SI, CS, SCLK, Incoming Signal Rise Time(28)
tRSI
–
–
50
ns
SI, CS, SCLK, Incoming Signal Fall Time(28)
tFSI
–
–
50
ns
Time from Falling Edge of CS to SO Low-impedance(29)
tSO(EN)
–
–
145
ns
Time from Rising Edge of CS to SO High-impedance(30)
tSO(DIS)
–
65
145
ns
Time from Rising Edge of SCLK to SO Data Valid(31)
0.2 VDD ≤ SO ≤ 0.8 x VDD, CL = 200pF
tVALID
–
65
105
ns
Notes
24.
Time necessary for the CSNS to be with ±5% of the targeted value.
25.
Watchdog timeout delay measured from the rising edge of WAKE or RST from a sleep state condition, to output turn-ON with the output
driven OFF and FSI floating. The values shown are for WDR setting of [00]. The accuracy of tWDTO is consistent for all configured
watchdog timeouts.
26.
RST
low duration measured with outputs enabled and going to OFF or disabled condition.
27.
Maximum setup time required for the 33874 is the minimum guaranteed time needed from the microcontroller.
28.
Rise and Fall time of incoming SI, CS, and SCLK signals suggested for design consideration to prevent the occurrence of double pulsing.
29.
Time required for output status data to be available for use at SO. 1.0k
Ω on pull-up on CS.
30.
Time required for output status data to be terminated at SO. 1.0k
Ω on pull-up on CS.
31.
Time required to obtain valid data out from SO following the rise of SCLK.
Table 4. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 6.0V
≤ VPWR ≤ 27V, 4.5V ≤ VDD ≤ 5.5V, -40°C ≤ TA ≤ 125°C, GND = 0V, unless
otherwise noted. Typical values noted reflect the approximate parameter means at TA = 25°C under nominal conditions, unless
otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit



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