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INA129-EP

www.ti.com

SBOS508 – DECEMBER 2009

PRECISION, LOW POWER INSTRUMENTATION AMPLIFIERS

Check for Samples: INA129-EP

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FEATURES

SUPPORTS DEFENSE, AEROSPACE

AND MEDICAL APPLICATIONS

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Low Offset Voltage

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Controlled Baseline

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Low Input Bias Current

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One Assembly/Test Site

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High CMR

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One Fabrication Site

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Inputs Protected to ±40 V

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Available in Military (–55°C/125°C)

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Wide Supply Range: ±2.25 V to ±18 V

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Low Quiescent Current

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Extended Product Life Cycle

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Extended Product-Change Notification

APPLICATIONS

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Product Traceability

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Bridge Amplifier

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Thermocouple Amplifier

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RTD Sensor Amplifier

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Medical Instrumentation

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Data Acquisition

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Custom temperature ranges available

DESCRIPTION

The INA129 is a low power, general purpose instrumentation amplifier offering excellent accuracy. The versatile

3-op amp design and small size make it ideal for a wide range of applications. Current-feedback input circuitry

provides wide bandwidth even at high gain (200 kHz at G = 100).

A single external resistor sets any gain from 1 to 10,000. The INA129 provides an industry-standard gain

equation; the INA129 gain equation is compatible with the AD620.

The INA129 is laser trimmed for very low offset voltage, drift and high common-mode rejection (113 dB at

G

≥ 100). It operates with power supplies as low as ±2.25 V, and quiescent current is only 750 μA - ideal for

battery operated systems. Internal input protection can withstand up to ±40 V without damage.

The INA129 is available in an SO-8 surface-mount package specified for the –55°C to 125°C temperature range.

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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2009, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.