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INA2134MDREP Datasheet(PDF) 2 Page - Texas Instruments

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Part # INA2134MDREP
Description  AUDIO DIFFERENTIAL LINE RECEIVER 0dB (G = 1)
PDF  18 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

INA2134MDREP Datasheet(HTML) 2 Page - Texas Instruments

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background image
Sense A
INA2134
Out A
V+
Ref A
–In A
+In A
12
13
14
2
11
V–
4
3
25kW
25kW
25kW
25kW
25kW
25kW
25kW
25kW
B
A
Sense B
Out B
Ref B
–In B
+In B
10
9
8
6
5
INA2134-EP
SBOS595C – MARCH 2012 – REVISED MARCH 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
ORDERABLE PART
TA
PACKAGE
TOP-SIDE MARKING
VID NUMBER
TRANSPORT MEDIA
NUMBER
INA2134MDREP
V62/12613-01XE
Tape and Reel, large
–55°C to 125°C
SOIC-14 – D
INA2134M
INA2134MDEP
V62/12613-02XE
Tube
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
over operating free-air temperature range (unless otherwise noted)
VALUE
UNIT
Supply voltage, V+ to V-
40
V
Input voltage range
±80
V
Output short-circuit (to ground)(2)
Continuous
Operating temperature
-55 to 125
°C
Storage temperature
-65 to 150
°C
Junction temperature
150
°C
Lead temperature (soldering, 10 s)
300
°C
ESD Rating
Human Body Model (HBM)
500
V
Machine Model (MM)
100
V
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
One channel per package.
2
Submit Documentation Feedback
Copyright © 2012, Texas Instruments Incorporated
Product Folder Link(s): INA2134-EP



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