R

4

9.09kΩ

R

3

1kΩ

R

7

97.6kΩ

R

6

40.2kΩ

C

2

1µF

C

1

1µF

C

3

0.47µF

C

4

22nF

R

2

2MΩ

R

8

402kΩ

R

5

634kΩ

Input from

Device

Under

Test

R

1

2MΩ

(OPA2227)

U1

(OPA2227)

U2

1

2

3

R

10

226kΩ

R

9

178kΩ

C

5

0.47µF

C

6

10nF

R

11

178kΩ

(OPA2227)

U2

7

V

OUT

6

5

100kΩ

V

OUT

1

2

3

OPA2227

22pF

10Ω

Device

Under

Test

OPA2227-EP

www.ti.com

SBOS594 – MARCH 2012

Figure 6 shows the 0.1-Hz to 10-Hz bandpass filter used to test the noise of the OPA2227. The filter circuit was

designed using Texas Instruments’ FilterPro software (available at www.ti.com). Figure 7 shows the configuration

of the OPA2227 for noise testing.

Figure 6. 0.1-Hz to 10-Hz Bandpass Filter Used to Test Wideband Noise of the OPA2227

Figure 7. Noise Test Circuit

Copyright © 2012, Texas Instruments Incorporated

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Product Folder Link(s): OPA2227-EP