TMDS261B datasheet(16/48 Pages) TI1

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VCC

AVCC

50 W

0.5pF

Driver

Receiver

D+

D–

D+

D–

ID =V

– V

D+

D–

)

D+

D–

ICM =

OD =V – V

(V +V )

OC =

S0371-02

TMDS261B

SLLS987A

– SEPTEMBER 2009 – REVISED JULY 2011

www.ti.com

SWITCHING CHARACTERISTICS (continued)

over recommended operating conditions (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP(1)

MAX

UNIT

AVCC = 3.3 V, RT = 50 Ω, input TMDS clock

frequency = 225 MHz. See Figure 14for

measurement setup; residual jitter is the total

jitter measured at TTP4 minus the jitter

tJITC(PP)

Peak-to-peak output residual clock jitter

measured at TTP1. See Figure 15 for the loss

profile of the cable used for tJITC(PP)

measurement. tJITC(PP) is measured at TMDS

differential clock signal crossing.

tCLK1

Valid clock-detect enable time

AVCC = 3.3 V, RT = 50 Ω, input TMDS clock

300

500

frequency = 300 MHz. See Figure 13.

tCLK2

Invalid clock-detect disable time

AVCC = 3.3 V, RT = 50 Ω, input TMDS clock

500

800

frequency = 1 MHz. See Figure 13.

tSEL1

Port selection time (see (4)

AVCC = 3.3 V, RT = 50 Ω

300

500

tSEL2

Port deselection time (see (5))

AVCC = 3.3 V, RT = 50 Ω

fCD

Clock-detect frequency

AVCC = 3.3 V, RT = 50 Ω. See Figure 13.

300

MHz

(4)

tSEL1 includes the time for the valid clock-detect enable time and tS1(HPD), because the tS1(HPD) event happens in parallel with tSEL1; thus,

the tSEL1 time is primarily the tCLK1 time.

(5)

tSEL2 is primarily the tS2(HPD) time.

Figure 9. TMDS Main-Link Test Circuit

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