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ADG5421 Datasheet(PDF) 16 Page - Analog Devices

Part # ADG5421
Description  High Voltage Latch-Up Proof, Dual SPST Switches
PDF  20 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADG5421 Datasheet(HTML) 16 Page - Analog Devices

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ADG5421/ADG5423
Data Sheet
Rev. 0 | Page 16 of 20
APPLICATIONS INFORMATION
The ADG54xx family of switches and multiplexers provide a
robust solution for instrumentation, industrial, aerospace, and
other harsh environments that are prone to latch-up, which is an
undesirable high current state that can lead to device failure and
persists until the power supply is turned off. The ADG5421/
ADG5423 high voltage switches allow single-supply operation
from 9 V to 40 V and dual-supply operation from ±9 V to ±22 V.
The ADG5421/ADG5423 (as well as other select devices within
this family) achieve an 8 kV human body model ESD rating,
which provides a robust solution, eliminating the need for
separate protection circuitry designs in some applications.
TRENCH ISOLATION
In the ADG5421/ADG5423, an insulating oxide layer (trench)
is placed between the NMOS and the PMOS transistors of each
CMOS switch. Parasitic junctions, which occur between the
transistors in junction-isolated switches, are eliminated, and the
result is a completely latch-up immune switch.
In junction isolation, the N and P wells of the PMOS and
NMOS transistors form a diode that is reverse-biased under
normal operation. However, during overvoltage conditions, this
diode can become forward-biased. The two transistors form a
silicon-controlled rectifier (SCR) type circuit, causing a
significant amplification of the current that, in turn, leads to
latch-up. With trench isolation, this diode is removed, and the
result is a latch-up immune switch.
Figure 32. Trench Isolation
NMOS
PMOS
P-WELL
N-WELL
BURIED OXIDE LAYER
HANDLE WAFER
TRENCH



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