ADS1274

ADS1278

SBAS367F

– JUNE 2007 – REVISED FEBRUARY 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERING INFORMATION

For the most current package and ordering information, see the Package Option Addendum at the end of this

document, or visit the device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

Over operating free-air temperature range unless otherwise noted

(1)

ADS1274, ADS1278

UNIT

AVDD to AGND

–0.3 to +6.0

V

DVDD, IOVDD to DGND

–0.3 to +3.6

V

AGND to DGND

–0.3 to +0.3

V

Momentary

100

mA

Input current

Continuous

10

mA

Analog input to AGND

–0.3 to AVDD + 0.3

V

Digital input or output to DGND

–0.3 to IOVDD + 0.3

V

Maximum junction temperature

+150

°C

ADS1274

–40 to +125

°C

Operating temperature range

ADS1278

–40 to +105

°C

Storage temperature range

–60 to +150

°C

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

2

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Product Folder Link(s): ADS1274 ADS1278