3

•

2 lots of AOZ8000HI up to 168 hrs of B/I for New Product release.

•

2 additional lots of AOZ8000HI up to 168 hrs of B/I for New UH_EPI process release.

•

2 lots of package qual testing (PCT, 250 cycles TC) for SC70 for package release to manufacturing.

IV. Qualification Tests Result

Test Item

Test Condition

Sample Size

Result

Comment

Pre-

Conditioning

Per JESD 22-A113

85 C

reflow@260

2 lot (82 /lot)

pass

Lot 1 (wafer lot# F162T.51-20, marking:

A02),

Lot 2 (wafer lot# F162T.51-20, marking:

A03),

HTOL

(pkg qual

burn-in )

Per JESD 22-A108_B

Vdd=6V

Temp = 125

2 lot (80 /lot)

pass

Lot 1 (wafer lot# F162T.51-20, marking:

A02), 80 units, passed 500 hrs .

Lot 2 (wafer lot# F162T.51-20, marking:

A03), 80 units, passed 500 hrs .

HTOL

(old UE003A

process)

Per JESD 22-A108_B

Vdd=6V

Temp = 125

2 lot (80 /lot)

pass

Lot 1 (wafer lot# F9AN1.51-8, marking:

ABR11), 80 units, passed 1000 hrs .

Lot 2 (wafer lot# F9AN1.51-10, marking:

CBU11), 80 units, passed 500 hrs .

HTOL

(new UH_EPI

process)

Per JESD 22-A108_B

Vdd=6V

Temp = 125

2 lot (80 /lot)

pass

Qual by extension using AOZ8000C

(same die in SOT23 pkg.)

Lot 1 (wafer lot# FNG88, marking:

AC001), 80 units, passed 500 hrs .

Lot 2 (wafer lot# FAYY3.02-3 marking:

AB008), 80 units, passed 500 hrs .

HAST

'130 +/- 2

psi, at VCC min power

dissapation

2 lot (60 /lot)

pass

Lot 1 (wafer lot# F162T.51-20, marking:

A02), 60 units, passed HAST 100 hrs .

Lot 2 (wafer lot# F162T.51-20, marking:

A03), 60 units, passed HAST 100 hrs .

Temperature

Cycle

'-65

air (2cyc/hr)

2 lot (82 /lot)

pass

Lot 1 (wafer lot# F162T.51-20, marking:

A02), 82 units, passed TC 500 cycles.

Lot 2 (wafer lot# F162T.51-20, marking:

A03), 82 units, passed TC 500 cycles.

Pressure Pot

121C, 15+/-1 PSIG,

RH= 100%

2 lot (82 /lot)

pass

Lot 1 (wafer lot# F162T.51-20, marking:

A02), 82 units, passed PCT 96 hrs.

Lot 2 (wafer lot# F162T.51-20, marking:

A03), 82 units, passed PCT 96 hrs.

ESD Rating

Per IEC-61000-4-2,

contact

3 units

pass

Lot 1 (wafer lot# FAYY3.02-3, marking:

AB008), 3 units passed ±12kV

ESD Rating

Per IEC-61000-4-2, air

3 units

pass

Lot 1 (wafer lot# FAYY3.02-3, marking:

AB008), 3 units passed ±15kV

Latch-up

Per JESD78A

3 units

pass

Lot 1 (wafer lot# FAYY3.02-3, marking:

AB008), 3 units passed Latch-up.

The qualification test results confirm that AOZ8000HI pass AOS quality and reliability

requirements for product release.