MA17501 datasheet(34/35 Pages) DYNEX

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MA17501

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9.0 RADIATION TOLERANCE

Total Dose Radiation Testing

For product procured to guaranteed total dose radiation

levels, each wafer lot will be approved when all sample

devices from each lot pass the total dose radiation test.

The sample devices will be subjected to the total dose

radiation level (Cobalt-60 Source), defined by the ordering

code, and must continue to meet the electrical parameters

specified in the data sheet. Electrical tests, pre and post

irradiation, will be read and recorded.

Dynex Semiconductor can provide radiation testing

compliant with Mil-Std-883 method 1019 Ionizing Radiation

(total dose) test.

Total Dose (Function to specification)*

3x10

5 Rad(Si)

Transient Upset (Stored data loss)

1x10

11 Rad(Si)/sec

Transient Upset (Survivability)

>1x10

12 Rad(Si)/sec

Neutron Hardness (Function to specification)

>1x10

15 n/cm2

Single Event Upset**

<1x10

-10 Errors/bit day

Latch Up

Not possible

* Other total dose radiation levels available on request

** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit

Table 10: Radiation Hardness Parameters

10.0 ORDERING INFORMATION

For details of reliability, QA/QC, test and assembly

options, see ‘Manufacturing Capability and Quality

Assurance Standards’ Section 9.

Unique Circuit Designator

Radiation Hard Processing

100 kRads (Si) Guaranteed

300 kRads (Si) Guaranteed

Radiation Tolerance

Ceramic DIL (Solder Seal)

Flatpack (Solder Seal)

Leadless Chip Carrier

Package Type

QA/QCI Process

(See Section 9 Part 4)

Test Process

(See Section 9 Part 3)

Assembly Process

(See Section 9 Part 2)

Rel 0

Rel 1

Rel 2

Rel 3/4/5/STACK

Class B

Class S

Reliability Level

MAx17501xxxxx

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