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PLSP0020JB-A Datasheet(PDF) 29 Page - Renesas Technology Corp |
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PLSP0020JB-A Datasheet(HTML) 29 Page - Renesas Technology Corp |
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29 / 51 page ![]() R8C/1A Group, R8C/1B Group 5. Electrical Characteristics Rev.1.40 Dec 08, 2006 Page 27 of 45 REJ03B0144-0140 NOTES: 1. VCC = 2.7 to 5.5 V at Topr = −20 to 85 °C / −40 to 85 °C, unless otherwise specified. 2. Definition of programming/erasure endurance The programming and erasure endurance is defined on a per-block basis. If the programming and erasure endurance is n (n = 100 or 10,000), each block can be erased n times. For example, if 1,024 1-byte writes are performed to block A, a 1 Kbyte block, and then the block is erased, the programming/erasure endurance still stands at one. However, the same address must not be programmed more than once per erase operation (overwriting prohibited). 3. Endurance to guarantee all electrical characteristics after program and erase. (1 to Min. value can be guaranteed). 4. If emergency processing is required, a suspend request can be generated independent of this characteristic. In that case the normal time delay to suspend can be applied to the request. However, we recommend that a suspend request with an interval of less than 650 µs is only used once because, if the suspend state continues, erasure cannot operate and the incidence of erasure error rises. 5. In a system that executes multiple programming operations, the actual erasure count can be reduced by writing to sequential addresses in turn so that as much of the block as possible is used up before performing an erase operation. For example, when programming groups of 16 bytes, the effective number of rewrites can be minimized by programming up to 128 groups before erasing them all in one operation. It is also advisable to retain data on the erase count of each block and limit the number of erase operations to a certain number. 6. If an error occurs during block erase, attempt to execute the clear status register command, then execute the block erase command at least three times until the erase error does not occur. 7. Customers desiring programming/erasure failure rate information should contact their Renesas technical support representative. 8. -40 °C for D version. 9. The data hold time includes time that the power supply is off or the clock is not supplied. Table 5.5 Flash Memory (Data flash Block A, Block B) Electrical Characteristics Symbol Parameter Conditions Standard Unit Min. Typ. Max. − Program/erase endurance(2) 10,000(3) −− times − Byte program time (Program/erase endurance ≤ 1,000 times) − 50 400 µs − Byte program time (Program/erase endurance > 1,000 times) − 65 −µs − Block erase time (Program/erase endurance ≤ 1,000 times) − 0.2 9 s − Block erase time (Program/erase endurance > 1,000 times) − 0.3 − s td(SR-SUS) Time Delay from suspend request until suspend −− 97+CPU clock × 6 cycles µs − Interval from erase start/restart until following suspend request 650 −− µs − Interval from program start/restart until following suspend request 0 −− ns − Time from suspend until program/erase restart −− 3+CPU clock × 4 cycles µs − Program, erase voltage 2.7 − 5.5 V − Read voltage 2.7 − 5.5 V − Program, erase temperature -20(8) − 85 °C − Data hold time(9) Ambient temperature = 55 °C20 −− year |
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