7-1241

Specifications CD4536BMS

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1

Note 1

4, 5, 13

1-3, 6-12, 14, 15

16

Static Burn-In 2

Note 1

4, 5, 13

8

1-3, 6, 7, 9-12,

14-16

Dynamic Burn-

In Note 1

-

1, 2, 6-8, 14, 15

9-12, 16

4, 5, 13

3

Irradiation

Note 2

4, 5, 13

8

1-3, 6, 7, 9-12,

14-16

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD = 10V ± 0.5V

Logic Diagram

FIGURE 1.

2

1

S

CLDIS

CL

R

Q

FF25

CLOCK

*

7

p

n

p

n

8-BYPASS

R

φ

Q

Q

φ

R

φ

Q

Q

φ

R

CL

Q

Q

D

R

CL

Q

Q

CLEN

FF1

FF2

FF3

FF8

INH

OSC

*

14

INH

*

3

IN 1

*

4

OUT 1

*

5

OUT 2

RS

RT

CT

G

F

E

D

C

B

A

NOTE: f

≈

1

3RT CT

, RS

≈ (5 → 10) x RT

CL

VDD

VSS

PROTECTION NETWORK