Introduction to self tests

AN3018

6/24

Doc ID 16081 Rev 2

1

Introduction to self tests

Self tests can be used at two times of a safety application:

●

At power on

●

During run time

Power on self tests focus on latent fault detection. They usually cover all modules of a given

microcontroller.

Run time self tests focus on single point of failure detection during the application safety

time. Additionally, some modules may require a specific run time check (for example, ADC

monitor) to be done during run time, so that the FIT rate can be guaranteed on those

modules.

1.1

Self tests for SPC564Ax

The application note is focused on describing the possible self tests that can be designed for

SPC564Ax. The description given is intended to provide for different uses according to

application requirements, such as power on or as run time self tests.