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AN2798 Datasheet(PDF) 33 Page - STMicroelectronics |
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AN2798 Datasheet(HTML) 33 Page - STMicroelectronics |
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33 / 38 page ![]() AN2798 PM6670AS evaluation tests 33/38 8.12 Thermal behavior The IC internal maximum and average temperature can be monitored by an IR camera. For the measurements in Figure 36 through 39 the test setup is: ● VIN = 24 V ● FSW = 360 kHz ● Pulse-skip mode ● IVDDQ = 4 A ● VTT rail powered by VDDQ ● TAMB = 25 °C By increasing the VTT current, the IC temperature changes as depicted in the following pictures. Figure 36. IVTT = 0 A, average IC temperature = 37.5 °C, max internal IC temperature = 40.1 °C |
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