OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK

S-8239B Series

Seiko Instruments Inc.

7

2. Ta =

−40°C to +85°C

*1

Table 6

(Ta =

−40°C to +85°C

Item

Symbol

Condition

Min.

Typ.

Max.

Unit

Test

Condition

Test

Circuit

Detection Voltage

Overcurrent 1 detection voltage

−

− 0.021

+ 0.021

V

1

1

Overcurrent 2 detection voltage

−

− 0.130

+ 0.130

V

1

1

Overcurrent 3 detection voltage

Overcurrent 3 detection function

"available"

0.70

1.20

1.70

V

1

1

UVLO detection voltage

−

1.85

2.00

2.15

V

1

1

Release Voltage

Overcurrent release voltage

0.5

1.2

1.7

V

1

1

Input Voltage, Operation Voltage

Operation voltage between

VDD pin and VSS pin

Output logic is determined

*3

1.5

−

8

V

−

−

Current Consumption

Current consumption during

normal operation

0.7

3.5

8.0

μA

2

2

Current consumption during

power-down

−

−

0.15

μA

2

2

Internal Resistance

Internal resistance between

VM pin and VDD pin

78

300

1310

k

Ω

3

3

Output Resistance

DO pin resistance "L"

1.2

5

15

k

Ω

4

4

Delay Time

Overcurrent 1 detection delay

time

−

× 0.2

× 1.8

ms

5

5

Overcurrent 2 detection delay

time

−

× 0.2

× 1.8

ms

5

5

Overcurrent 3 detection delay

time

Overcurrent 3 detection function

"available"

56

280

504

μs

5

5

UVLO detection delay time

−

0.98

4.90

8.82

s

5

5

*1. Since products are not screened at high and low temperatures, the specification for this temperature range is

guaranteed by design, not tested in production.

*3. It indicates that DO pin output logic is determined.