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GM1851-S08-R Datasheet(PDF) 5 Page - Unisonic Technologies |
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GM1851-S08-R Datasheet(HTML) 5 Page - Unisonic Technologies |
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5 / 10 page ![]() GM1851 LINEAR INTEGRATED CIRCUIT UNISONIC TECHNOLOGIES CO., LTD 5 of 10 www.unisonic.com.tw QW-R122-007,B ABSOLUTE MAXIMUM RATINGS PARAMETER SYMBOL RATINGS UNIT Supply Current ICC 19 mA Power Dissipation (Note 1) PD 1250 mW Operating Temperature TOPR -40 ~ +70 °C Storage Temperature TSTG -55 ~ +150 °C Note: Absolute maximum ratings are those values beyond which the device could be permanently damaged. Absolute maximum ratings are stress ratings only and functional device operation is not implied. ELECTRICAL CHARACTERISTICS (Ta=25°C, ISS=5mA) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT DC CHARACTERISTICS Power Supply Shunt Regulator Voltage Pin 8, Average Value 22 26 30 V Latch Trigger Voltage Pin 7 15 17.5 20 V Sensitivity Set Voltage Pin 8 to Pin 6 6 7 8.2 V Output Saturation Voltage Pin 1, Without Fault 100 240 mV Output Drive Current Pin 1, With Fault 0.5 1 2.4 mA Output External Current Sinking Capability Pin 1, Without Fault Vpin 1 Held to 0.3V (Note 4) 2.0 5 mA Output Saturation Resistance Pin 1, Without Fault 100 Ω Noise Integration Sink Current Ratio Pin 7, Ratio of Discharge Currents Between No Fault and Fault Conditions 2.0 2.8 3.6 μA/μA AC CHARACTERISTICS Normal Fault Current Sensitivity Figure 1 (Note 3) 3 5 7 mA Normal Fault Trip Time 500Ω Fault, Figure 2 (Note 2) 18 mS Normal Fault with Grounded Neutral Fault Trip Time 500Ω Normal Fault, 2Ω Neutral, Figure 2 (Note 2) 18 mS Note: 1. 2. 3. 4. For operation in ambient temperatures above 25℃, the device must be debated based on a 125℃ maximum junction temperature and a thermal resistance of 80℃/W junction to ambient for the DIP and 162/W for the SO Package. Average of 10 trials. Required UL sensitivity tolerance is such that external trimming of UTC GM1851 sensitivity will be necessary. This externally applied current is in addition to the internal ''output drive current '' source. FIGURE 1.Normal Fault Sensitivity Test Circuit |
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