KAI-04050 datasheet(21/49 Pages) ONSEMI

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KAI-04050 Image Sensor

www.truesenseimaging.com

Revision 5.0 PS-0009 Pg. 21

Defect Definitions

OPERATION CONDITIONS FOR DEFECT TESTING AT 40 °C

Description

Condition

Notes

Operational Mode

Two outputs, using VOUTa and VOUTc, continuous readout

HCCD Clock Frequency

10 MHz

Pixels Per Line

2560

Lines Per Frame

992

Line Time

259.8 μsec

Frame Time

256.8 msec

Photodiode Integration Time

Mode A: PD_Tint = Frame Time = 256.8 msec, no electronic shutter used

Mode B: PD_Tint = 33 msec, electronic shutter used

VCCD Integration Time

233.0 msec

Temperature

40 °C

Light Source

Continuous red, green and blue LED illumination

Operation

Nominal operating voltages and timing

Notes:

Horizontal overclocking used

Vertical overclocking used

VCCD Integration Time = 900 lines x Line Time, which is the total time a pixel will spend in the VCCD registers.

For monochrome sensor, only the green LED is used.

Defect Definitions for Testing at 40 °C

Description

Definition

Standard Grade

Grade 2

Notes

Major dark field defective

bright pixel

PD_Tint = Mode A  Defect ≥ 88 mV

PD_Tint = Mode B  Defect ≥ 12 mV

Major bright field defective

dark pixel

Defect ≥ 12%

Minor dark field defective

bright pixel

PD_Tint = Mode A  Defect ≥ 44 mV

PD_Tint = Mode B  Defect ≥ 6 mV

400

Cluster Defect

A group of 2 to 10 contiguous major defective

pixels, but no more than 2 adjacent defects

horizontally.

n/a

Cluster Defect

(Grade 2)

A group of 2 to 10 contiguous major defective

pixels

n/a

Column defect

A group of more than 10 contiguous major

defective pixels along a single column

Notes:

For the color device (KAI-04050-FBA, KAI-04050-CBA, KAI-04050-QBA, or KAI-04050-PBA), a bright field defective pixel

deviates by 12% with respect to pixels of the same color.

Column and cluster defects are separated by no less than two (2) good pixels in any direction (excluding single pixel

defects).

KAI-04050 Datasheet(PDF) 21 Page - ON Semiconductor

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