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LS3263 Datasheet(PDF) 3 Page - BOWIN ELECTRONIC CO.

Part # LS3263
Description  6 Dot Animation 4 Digit Alarm Clock With Calendar
PDF  9 Pages
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Manufacturer  BOWIN [BOWIN ELECTRONIC CO.]
Direct Link  http://www.bowin-ic.com.hk
Logo BOWIN - BOWIN ELECTRONIC CO.

LS3263 Datasheet(HTML) 3 Page - BOWIN ELECTRONIC CO.

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LSI
LS 3263
6 Dot Animation 4 Digit Alarm Clock With Calendar
“M” key will have auto advance. Press “S” key to date setting, it
can be set from 1 to 28/30/31(depend the month) by pressing “M” key.
Hold (2sec) the “M” key will have auto advance. Press “S” key to
hour setting, it can be set cycling from “12:
A”(12 hour format) to
“11: A”(12 hour format), “12: P”(12 hour format) to “11: P”(12
hour format) by pressing “M” key. Hold (2 sec) the “M” key will
have auto advance. Press “S” key to minute setting, it can be set
from “:00” to “:59” by pressing “M” key. Hold (2 sec) the “M”
key will have auto advance. Press “S” key to return normal mode
(without minute setting) or hold mode(with minute setting). In the hold
mode, press “M” key only to return normal mode.
Pin Assignment
DESIGNATION
TYPE
DESCRIPTION
B [0:1]
OUTPUT
Buzzer output
V1, V2
OUTPUT
Doubler output
VEE
OUTPUT
-1.5V
T2, T1
INPUT (PL)
TEST pin
OO
OUTPUT
32KHz oscillator output
OI
INPUT
32KHz oscillator input
VDD
POWER
+1.5V power supply
GND
POWER
Ground
I[0:5]
INPUT(PH)
Input key/option
O[0:3]
OUTPUT
Trigger output (O[0:2])
C[1:2]
OUTPUT
LCD Common output
S[1:14]
OUTPUT
LCD Segment output
Note: (PL) – pull low
(PH) - pull high
Absolute Maximum Ratings
Supply voltage Vdd - Vss..........................0 to 5V
Input voltage Vin.................................Vss to Vdd
Operating temperature Top .............-10°C to 60°C
Storing temperature Tst ...................-40°C to 70°C
*Comments
Stress above those listed under Absolute Maximum Ratings” may cause permanent damage to the
device.
These are stress rating only.
Functional operation of this device at these or any other conditions
above those indicated in the operational sections of this specification is not implied and exposure to absolute
maximum rating conditions for extended periods may affect device reliability.



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