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S-807 Datasheet(PDF) 21 Page - Seiko Instruments Inc |
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S-807 Datasheet(HTML) 21 Page - Seiko Instruments Inc |
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21 / 42 page ![]() HIGH-PRECISION VOLTAGE DETECTOR S-807 Series 20 Seiko Instruments Inc. 40. S-80747AL/AL-EB-X, S-80747AN-JB-X (Detection voltage : 4.587 to 4.813 V) (Unless otherwise specified : Ta=25 °C) Parameter Symbol Conditions Min. Typ. Max. Unit Test circuit Detection voltage -VDET 4.587 4.700 4.813 V 1 Hysteresis width VHYS -VDET ×0.02 -VDET ×0.05 -VDET ×0.08 V1 Current consumption ISS VDD = 6.0 V 1.0 3.0 µA2 Operating voltage VDD 1.0 15.0 V 1 Output current IOUT Nch VDS = 0.5 V VDD = 1.2 V 0.23 0.50 mA 3 VDD = 2.4 V 1.60 3.70 VDD = 3.6 V 3.18 7.00 Pch (CMOS output) VDS = 0.5 V VDD = 6.0 V 0.46 0.75 4 Temperature characteristic of - VDET Ta=-30 °C to 80°C ±0.59 mV/ °C 41. S-80748AL-EC-X, S-80748AN/AN-JC-X (Detection voltage : 4.684 to 4.916 V) (Unless otherwise specified : Ta=25 °C) Parameter Symbol Conditions Min. Typ. Max. Unit Test circuit Detection voltage -VDET 4.684 4.800 4.916 V 1 Hysteresis width VHYS -VDET ×0.02 -VDET ×0.05 -VDET ×0.08 V1 Current consumption ISS VDD = 6.0 V 1.0 3.0 µA2 Operating voltage VDD 1.0 15.0 V 1 Output current IOUT Nch VDS = 0.5 V VDD = 1.2 V 0.23 0.50 mA 3 VDD = 2.4 V 1.60 3.70 VDD = 3.6 V 3.18 7.00 Pch (CMOS output) VDS = 0.5 V VDD = 6.0 V 0.46 0.75 4 Temperature characteristic of - VDET Ta=-30 °C to 80°C ±0.60 mV/ °C 42. S-80749AL-ED-X, S-80749AN-JD-X (Detection voltage : 4.782 to 5.018 V) (Unless otherwise specified : Ta=25 °C) Parameter Symbol Conditions Min. Typ. Max. Unit Test circuit Detection voltage -VDET 4.782 4.900 5.018 V 1 Hysteresis width VHYS -VDET ×0.02 -VDET ×0.05 -VDET ×0.08 V1 Current consumption ISS VDD = 6.0 V 1.0 3.0 µA2 Operating voltage VDD 1.0 15.0 V 1 Output current IOUT Nch VDS = 0.5 V VDD = 1.2 V 0.23 0.50 mA 3 VDD = 2.4 V 1.60 3.70 VDD = 3.6 V 3.18 7.00 Pch (CMOS output) VDS = 0.5 V VDD = 6.0 V 0.46 0.75 4 Temperature characteristic of - VDET Ta=-30 °C to 80°C ±0.61 mV/ °C ∆-V DET ∆Ta ∆-V DET ∆Ta ∆-V DET ∆Ta |
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