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SN54AHCT240, SN74AHCT240

SCLS252M – OCTOBER 1995 – REVISED APRIL 2016

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Copyright © 1995–2016, Texas Instruments Incorporated

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

7 Specifications

7.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage range

–0.5

7

V

–0.5

7

V

–0.5

V

Input clamp current

–20

mA

Output clamp current

±20

mA

Continuous output current

±25

mA

±75

mA

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

7.2 ESD Ratings

MIN

MAX

UNIT

Storage temperature range

–65

150

°C

Electrostatic discharge

Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all

0

1000

V

Charged device model (CDM), per JEDEC specification

0

2000

(1)

Implications of Slow or Floating CMOS Inputs (SCBA004).

7.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

(1)

SN54AHCT240

SN74AHCT240

UNIT

MIN

MAX

MIN

MAX

Supply voltage

4.5

5.5

4.5

5.5

V

High-level input voltage

2

2

V

Low-level Input voltage

0.8

0.8

V

Input voltage

0

5.5

0

5.5

V

Output voltage

0

0

V

High-level output current

–8

–8

mA

Low-level output current

8

8

mA

Operating free-air temperature

–55

125

–40

125

°C