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SN54ALS996 Datasheet(PDF) 3 Page - Texas Instruments

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Part # SN54ALS996
Description  8-BIT D-TYPE EDGE-TRIGGERED READ-BACK LATCHES
PDF  17 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

SN54ALS996 Datasheet(HTML) 3 Page - Texas Instruments

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SN54ALS996, SN74ALS996
8BIT DTYPE EDGETRIGGERED READBACK LATCHES
SDAS098B − OCTOBER 1984 − REVISED JANUARY 1995
2−3
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
POST OFFICE BOX 1443
• HOUSTON, TEXAS 77251−1443
timing diagram
(T/C = H)
CLR
D
EN
RD
Q
OE
Async
Clear
Write
Input Data
Output
CLK
Read-Back Data
Output Data
Read
Back
tsu
th
tw
tsu
tdis
tdis
tdis
tp
th†
ten
ten
ten
† This hold time ensures that the read-back circuit will not create a conflict on the input data bus.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)‡
Supply voltage, VCC
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage, VI (OE, RD, EN, CLK, CLR, and T/C)
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage applied to D inputs and to disabled 3-state outputs
5.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: SN54ALS996
−55
°C to 125°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74ALS996
0
°C to 70°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range
−65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.



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