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DM505 Datasheet(PDF) 76 Page - Texas Instruments |
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DM505 Datasheet(HTML) 76 Page - Texas Instruments |
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76 / 286 page ![]() 76 DM505 SPRS976A – NOVEMBER 2016 – REVISED JANUARY 2017 www.ti.com Submit Documentation Feedback Specifications Copyright © 2016–2017, Texas Instruments Incorporated (1) Stresses beyond those listed as absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those listed under Section 5.4, Recommended Operating Conditions, is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. (2) All voltage values are with respect to VSS, unless otherwise noted. (3) See I/Os supplied by this power pin in Table 4-1 Ball Characteristics. (4) VDD is the voltage on the corresponding power-supply pin(s) for the IO. (5) Per JEDEC JESD78 at 125°C with specified I/O pin injection current and clamp voltage of 1.5 times maximum recommended I/O voltage and negative 0.5 times maximum recommended I/O voltage. (6) Per JEDEC JESD78 at 125°C. 5.2 ESD Ratings VALUE UNIT VESD Electrostatic discharge Human-Body model (HBM), per AEC Q100-002(1) ±1000 V Charged-device model (CDM), per AEC Q100-011 All pins ±250 Corner pins (A1, AB1, A22, AB22) ±750 (1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 5.3 Power on Hour (POH) Limits IP Duty Cycle Voltage Domain Voltage (V) (max) Frequency (MHz) (max) Tj(°C) POH All 100% All All Support OPPs Automotive Profile(1) 20000 (1) Automotive profile is defined as 20000 power on hours with junction temperature as follows: 5%@-40°C, 65%@70°C, 20%@110°C, 10%@125°C. (2) The information in this section is provided solely for your convenience and does not extend or modify the warranty provided under TI’s standard terms and conditions for TI semiconductor products. (3) POH is a functional of voltage, temperature and time. Usage at higher voltages and temperatures will result in a reduction in POH to achieve the same reliability performance. For assessment of alternate use cases, contact your local TI representative. |
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