22

ISO7760, ISO7761

ISO7762, ISO7763

SLLSER1A – AUGUST 2017 – REVISED AUGUST 2017

www.ti.com

Product Folder Links: ISO7760 ISO7761 ISO7762 ISO7763

Submit Documentation Feedback

Copyright © 2017, Texas Instruments Incorporated

(1)

See Table 2 for detailed isolation ratings.

8.3 Feature Description

Table 1 lists the device features.

Table 1. Device Features

PART NUMBER

CHANNEL DIRECTION

MAXIMUM

DATA RATE

DEFAULT

OUTPUT

PACKAGE

ISO7760

6 Forward,

0 Reverse

100 Mbps

High

DW-16

DBQ-16

ISO7760 with F suffix

6 Forward,

0 Reverse

100 Mbps

Low

DW-16

DBQ-16

ISO7761

5 Forward,

1 Reverse

100 Mbps

High

DW-16

DBQ-16

ISO7761 with F suffix

5 Forward,

1 Reverse

100 Mbps

Low

DW-16

DBQ-16

ISO7762

4 Forward,

2 Reverse

100 Mbps

High

DW-16

DBQ-16

ISO7762 with F suffix

4 Forward,

2 Reverse

100 Mbps

Low

DW-16

DBQ-16

ISO7763

3 Forward,

3 Reverse

100 Mbps

High

DW-16

DBQ-16

ISO7763 with F suffix

3 Forward,

3 Reverse

100 Mbps

Low

DW-16

DBQ-16

8.3.1 Electromagnetic Compatibility (EMC) Considerations

Many applications in harsh industrial environment are sensitive to disturbances such as electrostatic discharge

(ESD), electrical fast transient (EFT), surge and electromagnetic emissions. These electromagnetic disturbances

are regulated by international standards such as IEC 61000-4-x and CISPR 22. Although system-level

performance and reliability depends, to a large extent, on the application board design and layout, the ISO776x

family of devices incorporates many chip-level design improvements for overall system robustness. Some of

these improvements include:

•

Robust ESD protection for input and output signal pins and inter-chip bond pads.

•

Low-resistance connectivity of ESD cells to supply and ground pins.

•

Enhanced performance of high voltage isolation capacitor for better tolerance of ESD, EFT and surge events.

•

Bigger on-chip decoupling capacitors to bypass undesirable high energy signals through a low impedance

path.

•

PMOS and NMOS devices isolated from each other by using guard rings to avoid triggering of parasitic

SCRs.

•

Reduced common mode currents across the isolation barrier by ensuring purely differential internal operation.