Copyright

 ANPEC Electronics Corp.

Rev. A.5 - Oct., 2003

APL5521

www.anpec.com.tw

8

R e lia b ility te s t p ro g ra m

Te st ite m

M e th o d

D escrip tio n

SO L D ER A B IL IT Y

M IL -S TD -8 8 3 D -2 0 0 3

24 5

°C , 5 SE C

H O LT

M IL-S T D -8 8 3D -1 00 5 .7

10 00 H rs B ia s @ 1 25

°C

PC T

J ESD -2 2 - B, A1 0 2

1 6 8 Hrs , 1 0 0 % RH , 1 2 1

°C

TST

M IL -S TD -8 8 3 D -10 11 .9

-6 5

°C ~ 1 5 0°C , 20 0 C ycles

E S D

M IL -S T D -88 3 D -3 0 1 5.7

V H B M > 2K V, V M M > 2 0 0V

L a tc h -U p

J E S D 7 8

1 0 m s , I

Carrier Tape

A

J

B

T2

T1

C

t

Ao

E

W

Po

P

Ko

Bo

D1

D

F

P1

Application

A

B

C

J

T1

T2

W

P

E

SOP-8

330

±1

62

± 1.5

12.75 +

0.1 5

2 + 0.5

12.4 +0.2

2

± 0.2

12 + 0.3

- 0.1

8

± 0.1

1.75

± 0.1

Application

F

D

D1

Po

P1

Ao

Bo

Ko

t

SOP-8

5.5

± 0.1 1.55±0.1 1.55+ 0.25 4.0 ± 0.1 2.0 ± 0.1 6.4 ± 0.1 5.2± 0.1

2.1

± 0.1 0.3±0.013

(mm)