| Electronic Components Datasheet Search |
|
IXBD4410PI Datasheet(PDF) 7 Page - IXYS Corporation |
|
|
|||||||||||||||||||||||||||||
IXBD4410PI Datasheet(HTML) 7 Page - IXYS Corporation |
|
7 / 11 page ![]() 7 © 2004 IXYS All rights reserved IXBD4410 IXBD4411 Application The IXBD4410/4411 chipset devices are specifically designed as MOS- gated transistor drivers in half-bridge power converters, 1- and 3-phase motor controls, and UPS applications. The phase-leg PWM command is normally generated by previous (user provided) circuitry. It must be decomposed into two separate logic signals, one for the high-side and one for the low-side power transistors, with appropriate deadtime for each state transition. The deadtime insures non- overlapping conduction even if the turn-on and turn-off delay times of the power devices are unequal. The minimum deadtime should be greater than t dlh. A separate circuit, or an IC device like the IXYS deadtime generator IXDP630, can be used to perform this function. The ISOSMART™ chipset family of devices do not generate deadtime, although there is an internal lockout that prohibits one device form being commanded "on" before the other is commanded "off". This simplifies start- up and shutdown protection circuitry, preventing logic error during power-up from turning on both high-and low-side transistors simultaneously. Negative V EE Charge Pump Circuit Design The on-chip V EE generator provided in the IXBD4410/4411 generates a nega- tive power supply, regulated at 20 V below the positive V DD rail. If VDD is +10 V, V EE will be -10 V. If VDD is +15 V, VEE will be -5 V. This negative drive potential in the off-state is either desirable or required in many in- stances. When switching a clamped inductive load (Fig. 5), the turn-on of Q2 will commutate the freewheeling diode around Q1. Whether this diode is intrinsic (as in a MOSFET) or extrinsic (IGBT or bipolar), its reverse recovery is critical to proper circuit operation. At high turn-on di/dt in Q2 and near its rated voltage, the recovery of D1 can get quite "snappy" (the di/dt in the second half of the recovery process, after the diode has begun to recover its blocking capability, can get very large), creating a very high dv/dt across Q1. This dv/dt is impressed across the Miller capacitance of Q1, forcing a large current to flow out the gate reduces the voltage required to create a failure, this problem is even more likely to occur. In an industrial module package (e.g.: a 150 A/1200 V IGBT phase-leg module), the series induc- tance contributed by the long gate leads and connectors further compli- cate the design. In a heavily snubbered converter, or in a power supply design with low transformer leakage inductance, the design problem is relatively simple and negative drive is seldom required. However, in a modern snubberless or lightly snubbered converter design, it is important to keep the gate drive impedance high enough during transistor turnoff to limit the reapplied dv/dt (the transistor is its own 'active' snubber). This is always important for EMI control, and in the case of IGBT may be required to achieve the necessary RBSOA. At the same time, it is mandatory to keep the off-state gate drive impedance very low to assure the transistor remain off during induced dv/dt (including diode recovery dv/dt). In some instances, it is simply not possible to satisfy both criteria with 0 V applied in the off-state. In these cases the IXBD4410/4411 with V EE negative bias generator must be used. The internal V EE generator is a charge pump circuit. Referring to Fig. 6, an external charge pump capacitor is required between the CA and CB terminal of the device. If this current pulse causes a high enough voltage drop across the output impedance of the gate drive circuit, R out, Q1 will be turned on. The Q1 conduction in every instance Q2 is turned on (and vice versa), aside from degrading efficiency, can lead to catastrophic failure of both power transistors. At high temperature, where the -6 to -7 mV/ °C temperature coefficient of IGBT/MOSFET threshold Fig. 5: Switching a clamped inductive load Fig. 6: IXBD4410/4411 Detailed one phase circuit with dead time generator IXDP 630 1N5817 1N5817 |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |