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CY7C1069G Datasheet(PDF) 7 Page - Cypress Semiconductor |
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CY7C1069G Datasheet(HTML) 7 Page - Cypress Semiconductor |
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7 / 20 page ![]() Document Number: 001-81539 Rev. *J Page 7 of 20 CY7C1069G CY7C1069GE Maximum Ratings Exceeding maximum ratings may impair the useful life of the device. These user guidelines are not tested. Storage temperature ................................ –65 C to +150 C Ambient temperature with power applied ................................... –55 C to +125 C Supply voltage on VCC relative to GND ...............................–0.5 V to +6.0 V DC voltage applied to outputs in High Z State [7] ................................ –0.5 V to VCC + 0.5 V DC input voltage [7] ............................. –0.5 V to VCC + 0.5 V Current into outputs (LOW) ........................................ 20 mA Static Discharge Voltage (MIL-STD-883, Method 3015) ................................. > 2001 V Latch up current ..................................................... > 140 mA Operating Range Grade Ambient Temperature VCC Industrial –40 C to +85 C 1.65 V to 2.2 V, 2.2 V to 3.6 V, 4.5 V to 5.5 V DC Electrical Characteristics Over the Operating Range of –40 C to 85 C Parameter Description Test Conditions 10 ns / 15 ns Unit Min Typ [8] Max VOH Output HIGH voltage 1.65 V to 2.2 V VCC = Min, IOH = –0.1 mA 1.4 – – V 2.2 V to 2.7 V VCC = Min, IOH = –1.0 mA 2.0 – – 2.7 V to 3.0 V VCC = Min, IOH = –4.0 mA 2.2 – – 3.0 V to 3.6 V VCC = Min, IOH = –4.0 mA 2.4 – – 4.5 V to 5.5 V VCC = Min, IOH = –4.0 mA 2.4 – – 4.5 V to 5.5 V VCC = Min, IOH = –0.1 mA VCC – 0.4 [9] –– VOL Output LOW voltage 1.65 V to 2.2 V VCC = Min, IOL = 0.1 mA – – 0.2 V 2.2 V to 2.7 V VCC = Min, IOL = 2 mA – – 0.4 2.7 V to 3.6 V VCC = Min, IOL = 8 mA – – 0.4 4.5 V to 5.5 V VCC = Min, IOL = 8 mA – – 0.4 VIH Input HIGH voltage 1.65 V to 2.2 V – 1.4 – VCC + 0.2 V 2.2 V to 2.7 V – 2.0 – VCC + 0.3 2.7 V to 3.6 V – 2.0 – VCC + 0.3 4.5 V to 5.5 V – 2.0 – VCC + 0.5 VIL Input LOW voltage [7] 1.65 V to 2.2 V – –0.2 – 0.4 V 2.2 V to 2.7 V – –0.3 – 0.6 2.7 V to 3.6 V – –0.3 – 0.8 4.5 V to 5.5 V – –0.5 – 0.8 IIX Input leakage current GND < VIN < VCC –1.0 – +1.0 A IOZ Output leakage current GND < VOUT < VCC, Output disabled –1.0 – +1.0 A ICC Operating supply current VCC = Max, IOUT = 0 mA, CMOS levels f = 100 MHz – 90.0 110.0 mA f = 66.7 MHz – 70.0 80.0 ISB1 Automatic CE power down current – TTL inputs Max VCC, CE > VIH [10], VIN > VIH or VIN < VIL, f = fMAX – – 40.0 mA ISB2 Automatic CE power down current – CMOS inputs Max VCC, CE > VCC – 0.2 V [10], VIN > VCC – 0.2 V or VIN < 0.2 V, f = 0 – 20.0 [8] 30.0 mA Notes 7. VIL(min) = –2.0 V and VIH(max) = VCC + 2 V for pulse durations of less than 20 ns. 8. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = 1.8 V (for VCC range of 1.65 V–2.2 V), VCC =3V (for VCC range of 2.2 V–3.6 V), and VCC = 5 V (for VCC range of 4.5 V–5.5 V), TA = 25 °C. 9. This parameter is guaranteed by design and is not tested. 10. For all dual chip enable devices, CE is the logical combination of CE1 and CE2. When CE1 is LOW and CE2 is HIGH, CE is LOW; when CE1 is HIGH or CE2 is LOW, CE is HIGH. |
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