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ISL6207CB Datasheet(PDF) 7 Page - Renesas Technology Corp |
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ISL6207CB Datasheet(HTML) 7 Page - Renesas Technology Corp |
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7 / 10 page ![]() ISL6207 FN9075 Rev 8.00 Page 7 of 10 December 2, 2005 The next larger standard value capacitance is 0.22 F. A good quality ceramic capacitor is recommended. Power Dissipation Package power dissipation is mainly a function of the switching frequency and total gate charge of the selected MOSFETs. Calculating the power dissipation in the driver for a desired application is critical to ensuring safe operation. Exceeding the maximum allowable power dissipation level will push the IC beyond the maximum recommended operating junction temperature of 125°C. The maximum allowable IC power dissipation for the SO-8 package is approximately 800mW. When designing the driver into an application, it is recommended that the following calculation be performed to ensure safe operation at the desired frequency for the selected MOSFETs. The power dissipated by the driver is approximated as: where fsw is the switching frequency of the PWM signal. VU and VL represent the upper and lower gate rail voltage. QU and QL is the upper and lower gate charge determined by MOSFET selection and any external capacitance added to the gate pins. The IDDQ VCC product is the quiescent power of the driver and is typically negligible. Layout Considerations Reducing Phase Ring The parasitic inductances of the PCB and power devices (both upper and lower FETs) could cause increased PHASE ringing, which may lead to voltages that exceed the absolute maximum rating of the devices. When PHASE rings below ground, the negative voltage could add charge to the bootstrap capacitor through the internal bootstrap diode. Under worst-case conditions, the added charge could overstress the BOOT and/or PHASE pins. To prevent this from happening, the user should perform a careful layout inspection to reduce trace inductances, and select low lead inductance MOSFETs and drivers. D2PAK and DPAK packaged MOSFETs have high parasitic lead inductances, as opposed to SOIC-8. If higher inductance MOSFETs must be used, a Schottky diode is recommended across the lower MOSFET to clamp negative PHASE ring. A good layout would help reduce the ringing on the phase and gate nodes significantly: • Avoid using vias for decoupling components where possible, especially in the BOOT-to-PHASE path. Little or no use of vias for VCC and GND is also recommended. Decoupling loops should be short. • All power traces (UGATE, PHASE, LGATE, GND, VCC) should be short and wide, and avoid using vias. If vias must be used, two or more vias per layer transition is recommended. • Keep the SOURCE of the upper FET as close as thermally possible to the DRAIN of the lower FET. • Keep the connection in between the SOURCE of lower FET and power ground wide and short. • Input capacitors should be placed as close to the DRAIN of the upper FET and the SOURCE of the lower FET as thermally possible. Note: Refer to Intersil Tech Brief TB447 for more information. 0.0 0.4 0.1 0.2 0.3 0.5 0.6 0.7 0.8 0.9 1.0 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 VBOOT(V) FIGURE 2. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE VOLTAGE QGATE = 100nC 50nC 20nC Pfsw 1.5VUQU VLQL + I DDQVCC + = FREQUENCY (kHz) FIGURE 3. POWER DISSIPATION vs FREQUENCY 0800 200 400 600 1000 1200 1400 1600 1800 2000 1000 900 800 700 600 500 400 300 200 100 0 QU=20nC QL=50nC QL=50nC QU=50nC QU=50nC QL=100nC QU=100nC QL=200nC |
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