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831742I Datasheet(PDF) 7 Page - Integrated Device Technology |
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831742I Datasheet(HTML) 7 Page - Integrated Device Technology |
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7 / 18 page  7 ©2017 Integrated Device Technology, Inc August 17, 2017 831742I Datasheet Parameter Measurement Information 3.3V HCSL Output Load AC Test Circuit Differential Input Level Output Skew 3.3V HCSL Output Load AC Test Circuit Part-to-Part Skew Propagation Delay 475 Ω 33 Ω 50 Ω 50 Ω 33 Ω 49.9 Ω 49.9 Ω HCSL GND 2pF 2pF Qx nQx 0V IREF VDD 3.3V±0.3V This load condition is used for VRB, VMAX, VMIN, VCROSS, and VCROSS measurements. V CMR Cross Points V PP VDD GND nCLK[0:3] CLK[0:3] Qx nQx Qy nQy HCSL GND 0V 0V SCOPE IREF VDD This load condition is used for tsk(o), tsk(pp), tsk(i), tPD and tjit measurements. 3.3V±0.3V Qx nQx tsk(pp) Par t 1 Par t 2 Qy nQy t PD nCLK[0:3] CLK[0:3] nQA, nQB QA, QB |
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