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GD25Q40CSEG Datasheet(PDF) 43 Page - GigaDevice Semiconductor (Beijing) Inc. |
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GD25Q40CSEG Datasheet(HTML) 43 Page - GigaDevice Semiconductor (Beijing) Inc. |
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43 / 64 page  3.3V Uniform Sector Dual and Quad Serial Flash GD25Q40C 43 Figure 40. Maximum Negative and Positive Overshoot Waveform 8.4. CAPACITANCE MEASUREMENT CONDITIONS Symbol Parameter Min Typ Max Unit Conditions CIN Input Capacitance 6 pF VIN=0V COUT Output Capacitance 8 pF VOUT=0V CL Load Capacitance 30 pF Input Rise And Fall time 5 ns Input Pulse Voltage 0.1VCC to 0.8VCC V Input Timing Reference Voltage 0.2VCC to 0.7VCC V Output Timing Reference Voltage 0.5VCC V Figure 41. Input Test Waveform and Measurement Level 0.8VCC 0.1VCC 0.7VCC 0.2VCC 0.5VCC AC Measurement Level Input timing reference level Output timing reference level Note: Input pulse rise and fall time are <5ns Vss 20ns Maximum Negative Overshoot Waveform Maximum Positive Overshoot Waveform 20ns 20ns Vss-2.0V Vcc 20ns 20ns 20ns Vcc + 2.0V |
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