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AD8421 Datasheet(PDF) 5 Page - Analog Devices

Part # AD8421
Description  Precision Instrumentation Amplifier with Level Shift and Output Clamping
PDF  28 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AD8421 Datasheet(HTML) 5 Page - Analog Devices

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LT6372-1
5
Rev. 0
For more information www.analog.com
ELECTRICAL CHARACTERISTICS The
l
denotes the specifications which apply over the specified
temperature range, otherwise specifications are at TA = 25°C. VS = ±15V, VCM = VREF1 = VREF2 = 0V, VCLLO = V–, VCLHI = V+, RL = 2kΩ.
SYMBOL PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
RREFIN
REF Input Resistance
REF1 or REF2, Untested REF pin floating
30
kΩ
IREFIN
REF Input Current
V+IN = V–IN = VREF1 = VREF2= 0V, REF1 or REF2
l
–20
–30
–14
–7
3
μA
μA
VREF
REF Voltage Range
REF1 or REF2
l
V–
V+
V
AVREF
REF Gain to Output
VREF1 = 0V to 5V, VREF2 = 0V
0.5
V/V
REF Gain Error
VREF1 = 0V to 5V, VREF2 = 0V
l
–175
–200
±50
175
200
ppm
ppm
CLLO Input Current
VCLLO = 0V
l
1
μA
CLHI Input Current
VCLHI = 5V
l
1
μA
CLLO Input Operating Voltage Range
Outside this range CLLO is disabled
l
V– + 3
V+ – 2
V
CLHI Input Operating Voltage Range
Outside this range CLHI is disabled
l
V– + 2
V+ – 2.5
V
CLLO Clamp Voltage (VOUT – VCLLO)
l
–0.57
–0.74
–0.45
V
V
CLHI Clamp Voltage (VOUT – VCLHI)
l
0.45
0.55
0.755
V
V
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: Gains higher than 1000 are possible but the resulting low RG values
can make PCB and package lead resistance a significant error source.
Note 3: Gain tests are performed with –IN at mid-supply and +IN driven.
Note 4: When the gain is greater than 1 the gain error and gain drift
specifications do not include the effect of external gain set resistor RG.
Note 5: This specification is guaranteed by design.
Note 6: This specification is guaranteed with high-speed automated testing.
Note 7: This parameter is measured in a high speed automatic tester that
does not measure the thermal effects with longer time constants. The
magnitude of these thermal effects are dependent on the package used,
PCB layout, heat sinking and air flow conditions.
Note 8: For more information on how offsets relate to the amplifiers, see
section “Input and Output Offset Voltage” in the Applications section.
Note 9: Hysteresis in output voltage is created by mechanical stress
that differs depending on whether the IC was previously at a higher or
lower temperature. Output voltage is always measured at 25°C, but
the IC is cycled to the hot or cold temperature limit before successive
measurements. Hysteresis is roughly proportional to the square of the
temperature change. For instruments that are stored at well controlled
temperatures (within 20 or 30 degrees of operational temperature),
hysteresis is usually not a significant error source. Typical hysteresis is the
worst case of 25°C to cold to 25°C or 25°C to hot to 25°C, preconditioned
by one thermal cycle.
Note 10: Referred to the input.



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