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ADRF5047BCCZN-R7 Datasheet(PDF) 11 Page - Analog Devices

Part # ADRF5047BCCZN-R7
Description  Silicon SP4T Switch, Reflective, 9 kHz to 44 GHz
PDF  15 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADRF5047BCCZN-R7 Datasheet(HTML) 11 Page - Analog Devices

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Data Sheet
ADRF5047
Rev. 0 | Page 11 of 15
APPLICATIONS INFORMATION
EVALUATION BOARD
The ADRF5047-EVALZ is a 4-layer evaluation board. The outer
copper (Cu) layers are 0.5 oz (0.7 mil) plated to 1.5 oz (2.2 mil)
and are separated by dielectric materials. Figure 23 shows the
evaluation board cross sectional view.
0.5oz Cu (0.7mil)
RO4003
0.5oz Cu (0.7mil)
1.5oz Cu (2.2mil)
1.5oz Cu (2.2mil)
W = 14mil
G = 7mil
T = 2.2mil
H = 8mil
1.5oz Cu (2.2mil)
1.5oz Cu (2.2mil)
Figure 23. Evaluation Board Cross Sectional View
All RF and dc traces are routed on the top copper layer, whereas
the inner and bottom layers are grounded planes that provide a
solid ground for the RF transmission lines. The top dielectric
material is 8 mil Rogers RO4003, offering optimal high frequency
performance. The middle and bottom dielectric materials provide
mechanical strength. The overall board thickness is 62 mil, which
allows 2.4 mm RF launchers to be connected at the board edges.
Figure 24 shows the top view of the evaluation board.
Figure 24. Evaluation Board Layout, Top View
The RF transmission lines were designed using a coplanar
waveguide (CPWG) model, with a trace width of 14 mil and
ground clearance of 7 mil to have a characteristic impedance of
50 Ω. The RF transmission lines are extended by 8 mil from
package edge to the tapered line used for RF pin transition as
shown in Figure 25. For optimal RF and thermal grounding, as
many plated through vias as possible are arranged around
transmission lines and under the exposed pad of the package.
Figure 25. RF Transmission Lines
Two power supply ports are connected to the VDD and VSS
test points, control voltages are connected to the V1 and V2
test points, and the ground reference is connected to the GND
test point.
On the supply traces, a 100 pF bypass capacitor is used to filter
the high frequency noise. Additionally, unpopulated components
positions are available for applying extra bypass capacitors.
On the control traces, there are provisions for the resistor capacitor
(RC) filter to eliminate dc-coupled noise, if needed, by the
application. The resistor can also improve the isolation between
the RF and the control signal.
The RF input and output ports (RFC, RF1 to RF4) are connected
through 50 Ω transmission lines to the 2.4 mm RF launchers.
These high frequency RF launchers are by contact and not
soldered onto the board.
A thru calibration line (THRU CAL) connects the unpopulated
RF launchers. This transmission line is used to calibrate out the
board loss effects from the ADRF5047-EVALZ evaluation board
measurements to determine the device performance at the pins
of the IC. Figure 26 shows the typical board loss at room
temperature, the embedded insertion loss, and the de-embedded
insertion loss for the ADRF5047.
0
–8
050
FREQUENCY (GHz)
–7
–6
–5
–4
–3
–2
–1
5
101520
253035
40
45
THRU LOSS
EMBEDDED INSERTION LOSS
DEEMBEDDED INSERTION LOSS
Figure 26. Insertion Loss vs. Frequency
Figure 27 and Figure 28 shows the ADRF5047-EVALZ assembly
drawing with component placement and the schematic,
respectively.



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