2.

Test Circuits

The following figure shows the test circuit of the ARF476FL device.

Figure 2-1. 128 MHz Test Circuit

Note:  The value of L1 must be adjusted as the supply voltage is changed to maintain resonance in the output

circuit. At 128 MHz its value changes from approximately 40 nH at 100 V, to 30 nH at 150 V.

With the 50 Ω drain-to-drain load, the duty cycle above 100 V must be reduced to ensure power dissipation is within

the limits of the device. Maximum pulse length should be 100 ms or less.

ARF476FL

Test Circuits

and its subsidiaries

Datasheet

DS00004436A-page 7