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SPC584BX Datasheet(PDF) 124 Page - STMicroelectronics

Part # SPC584BX
Description  32-bit Power Architecture microcontroller for automotive ASIL-B applications
PDF  142 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

SPC584BX Datasheet(HTML) 124 Page - STMicroelectronics

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Package information
SPC584Bx
124/142
DS11701 Rev 4
5.5.3
eTQFP144
5.5.4
LQFP176
4. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
5. Thermal resistance between the die and the exposed pad ground on the bottom of the package based on simulation
without any interface resistance.
6. Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2.
Table 71. Thermal characteristics for 144 exposed pad eTQFP package
Symbol
C
Parameter(1)
Conditions
Value
Unit
RJA
CC
D Junction-to-Ambient, Natural Convection(2) Four layer board (2s2p)
28.5
°C/W
RJMA
CC
D
Junction-to-Moving-Air, Ambient(2)
At 200 ft./min., four layer
board (2s2p)
22.1
°C/W
RJB
CC
D
Junction-to-board(3)
—
14.5
°C/W
RJCtop
CC
D
Junction-to-case top(4)
—
13.7
°C/W
RJCbottom CC D
Junction-to-case bottom(5)
—4.4
°C/W
JT
CC
D
Junction-to-package top(6)
Natural convection
3.7
°C/W
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal.
3. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured
on the top surface of the board near the package.
4. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
5. Thermal resistance between the die and the exposed pad ground on the bottom of the package based on simulation
without any interface resistance.
6. Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2.
Table 72. Thermal characteristics for 176 exposed pad LQFP package
Symbol
C
Parameter(1)
Conditions
Value
Unit
RJA
CC
D Junction-to-Ambient, Natural Convection(2) Four layer board (2s2p)
28
°C/W
RJMA
CC
D
Junction-to-Moving-Air, Ambient(2)
at 200 ft./min., four layer
board (2s2p)
21
°C/W
RJB
CC
D
Junction-to-board(3)
15.7
°C/W
RJCtop
CC
D
Junction-to-case top(4)
18.1
°C/W
RJCbottom CC D
Junction-to-case bottom(5)
—
4.0
°C/W
JT
CC
D
Junction-to-package top(6)
Natural convection
3.7
°C/W
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal.



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