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SPC584BX Datasheet(PDF) 124 Page - STMicroelectronics |
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SPC584BX Datasheet(HTML) 124 Page - STMicroelectronics |
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124 / 142 page ![]() Package information SPC584Bx 124/142 DS11701 Rev 4 5.5.3 eTQFP144 5.5.4 LQFP176 4. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). 5. Thermal resistance between the die and the exposed pad ground on the bottom of the package based on simulation without any interface resistance. 6. Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. Table 71. Thermal characteristics for 144 exposed pad eTQFP package Symbol C Parameter(1) Conditions Value Unit RJA CC D Junction-to-Ambient, Natural Convection(2) Four layer board (2s2p) 28.5 °C/W RJMA CC D Junction-to-Moving-Air, Ambient(2) At 200 ft./min., four layer board (2s2p) 22.1 °C/W RJB CC D Junction-to-board(3) — 14.5 °C/W RJCtop CC D Junction-to-case top(4) — 13.7 °C/W RJCbottom CC D Junction-to-case bottom(5) —4.4 °C/W JT CC D Junction-to-package top(6) Natural convection 3.7 °C/W 1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. 2. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal. 3. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. 4. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). 5. Thermal resistance between the die and the exposed pad ground on the bottom of the package based on simulation without any interface resistance. 6. Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. Table 72. Thermal characteristics for 176 exposed pad LQFP package Symbol C Parameter(1) Conditions Value Unit RJA CC D Junction-to-Ambient, Natural Convection(2) Four layer board (2s2p) 28 °C/W RJMA CC D Junction-to-Moving-Air, Ambient(2) at 200 ft./min., four layer board (2s2p) 21 °C/W RJB CC D Junction-to-board(3) 15.7 °C/W RJCtop CC D Junction-to-case top(4) 18.1 °C/W RJCbottom CC D Junction-to-case bottom(5) — 4.0 °C/W JT CC D Junction-to-package top(6) Natural convection 3.7 °C/W 1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. 2. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal. |
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