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ADL5569BCPZ-R7 Datasheet(PDF) 5 Page - Analog Devices |
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ADL5569BCPZ-R7 Datasheet(HTML) 5 Page - Analog Devices |
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5 / 23 page ![]() Data Sheet ADL5569 Rev. C | Page 5 of 23 Parameter Test Conditions/Comments Min Typ Max Unit 4000 MHz HD2 −58 dBc HD3 −48 dBc OIP3 25 dBm IMD3 −48 dBc OIP2 59 dBm IMD2 −58 dBc OP1dB 14.3 dBm NF2 12.1 dB NSD, RTI2 2.5 nV/√Hz 1 S parameters are taken with the device under test (DUT) itself. The printed circuit board (PCB) is not used in the measurement. 2 NSD RTI is calculated from the noise figure, as follows: NSD (RTI) = ½ × IN NF R kT × − × 1) 10 4 /10 ( where: k is Boltzmann's constant, which equals 1.381 × 10−23J/K. T is the standard absolute temperature for evaluating noise figure, which equals 290 K. RIN is the differential input impedance of each amplifier, which equals 100 Ω. |
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