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STN6N60M2 Datasheet(PDF) 4 Page - STMicroelectronics |
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STN6N60M2 Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 13 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD (1) Source-drain current - 5.5 A ISDM (2) Source-drain current (pulsed) - 8 A VSD (3) Forward on voltage ISD = 4 A, VGS = 0 V - 1.6 V trr Reverse recovery time ISD = 4 A, di/dt = 100 A/µs, VDD = 60 V, (see Figure 16. Test circuit for inductive load switching and diode recovery times) - 229 ns Qrr Reverse recovery charge - 721 nC IRRM Reverse recovery current - 6.3 A trr Reverse recovery time ISD = 4 A, di/dt = 100 A/µs, VDD = 60 V, Tj = 150 °C (see Figure 16. Test circuit for inductive load switching and diode recovery times) - 288 ns Qrr Reverse recovery charge - 936 nC IRRM Reverse recovery current - 6.5 A 1. Limited by maximum junction temperature. 2. Pulse width limited by safe operating area. 3. Pulsed: pulse duration = 300 µs, duty cycle 1.5%. STN6N60M2 Electrical characteristics DS12926 - Rev 2 page 4/13 |
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