TLP2962F

6

12.

12.

12.

12. Test Circuits and Characteristics Curves

Test Circuits and Characteristics Curves

Test Circuits and Characteristics Curves

Test Circuits and Characteristics Curves

12.1.

12.1.

12.1.

12.1. Test Circuits

Test Circuits

Test Circuits

Test Circuits

Fig.

Fig.

Fig.

Fig. 12.1.1

12.1.1

12.1.1

12.1.1 IIIIOH

OH

OH

OH

Test Circuit

Test Circuit

Test Circuit

Test Circuit

Fig.

Fig.

Fig.

Fig. 12.1.2

12.1.2

12.1.2

12.1.2 V

V

V

VOL

OL

OL

OL

Test Circuit

Test Circuit

Test Circuit

Test Circuit

Fig.

Fig.

Fig.

Fig. 12.1.3

12.1.3

12.1.3

12.1.3 IIIICCH

CCH

CCH

CCH

Test Circuit

Test Circuit

Test Circuit

Test Circuit

Fig.

Fig.

Fig.

Fig. 12.1.4

12.1.4

12.1.4

12.1.4 IIIICCL

CCL

CCL

CCL

Test Circuit

Test Circuit

Test Circuit

Test Circuit

Fig.

Fig.

Fig.

Fig. 12.1.5

12.1.5

12.1.5

12.1.5 Switching Time Test Circuit and Waveform

Switching Time Test Circuit and Waveform

Switching Time Test Circuit and Waveform

Switching Time Test Circuit and Waveform

Fig.

Fig.

Fig.

Fig. 12.1.6

12.1.6

12.1.6

12.1.6 Common-Mode Transient Immunity Test Circuit and Waveform

Common-Mode Transient Immunity Test Circuit and Waveform

Common-Mode Transient Immunity Test Circuit and Waveform

Common-Mode Transient Immunity Test Circuit and Waveform

2015-12-16

Rev.3.0

©2015 Toshiba Corporation