6.42

71V321L

High Speed 3.3V 2K x 8 Dual-Port Static RAM with Interrupts

Industrial and Commercial Temperature Ranges

4

DC Electrical Characteristics Over the Operating

Temperature and Supply Voltage Range(1,2) (VCC = 3.3V ± 0.3V)

NOTES:

1. 'X' in part numbers indicates power rating (S or L).

2. VCC = 3.3V, TA = +25°C, and are not production tested. ICCDC = 70mA (Typ.).

3. At f = fMAX, address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of 1/tRC and using "AC Test Conditions" of input levels

of GND to 3V.

4. f = 0 means no address or control lines change. Applies only to inputs at CMOS level standby.

5. Port "A" may be either left or right port. Port "B" is opposite from port "A".

Symbol

Parameter

Test Condition

Version

71V321X25

Com'l & Ind

71V321X35

Com'l & Ind

71V321X55

Com'l & Ind

Unit

Typ.

Max.

Typ.

Max.

Typ.

Max.

ICC

Dynamic Operating

Current

(Both Ports Active)

CE = VIL

, Outputs Disabled

SEM = VIH

f = fMAX(3)

COM'L

S

L

55

55

130

100

55

55

125

95

55

55

115

85

mA

IND

L

55

130

55

125

55

115

ISB1

Standby Current

(Both Ports - TTL

Level Inputs)

CER

= CEL = VIH

SEMR = SEML = VIH

f = fMAX(3)

COM'L

S

L

15

15

35

20

15

15

35

20

15

15

35

20

mA

IND

L

15

35

15

35

15

35

ISB2

Standby Current

(One Port - TTL

Level Inputs)

CE"A"

= VIL and CE"B" = VIH(5)

Active Port Outputs Disabled,

f=fMAX(3)

SEMR = SEML = VIH

COM'L

S

L

25

25

75

55

25

25

70

50

25

25

60

40

mA

IND

L

25

75

25

70

25

60

ISB3

Full Standby Current

(Both Ports - All

CMOS Level Inputs)

Both Ports CEL and

CER

> VCC - 0.2V

VIN > VCC - 0.2V or

VIN < 0.2V, f = 0(4)

SEMR = SEML > VCC - 0.2V

COM'L

S

L

1.0

0.2

5

3

1.0

0.2

5

3

1.0

0.2

5

3

mA

IND

L

0.2

6

1.0

5

1.0

5

ISB4

Full Standby Current

(One Port - All

CMOS Level Inputs)

CE"A"

< 0.2V and

CE"B"

> VCC - 0.2V(5)

SEMR = SEML > VCC - 0.2V

VIN > VCC - 0.2V or VIN < 0.2V

Active Port Outputs Disabled

f = fMAX(3)

COM'L

S

L

25

25

70

55

25

25

65

50

25

25

55

40

mA

IND

L

25

70

25

65

25

55

3026 tbl 06

Data Retention Characteristics (L Version Only)

Symbol

Parameter

Test Condition

Min.

Typ. (1)

Max.

Unit

VDR

VCC for Data Retention

2.0

___

0V

ICCDR

Data Retention Current

VCC = 2V, CE > VCC - 0.2V

COM'L.

___

100

500

µA

tCDR(3)

Chip Deselect to Data

Retention Time

VIN > VCC - 0.2V or VIN < 0.2V

IND.

___

100

1000

µA

0

___

___

V

tR(3)

Operation Recovery Time

tRC(2)

___

___

V

3026 tbl 07

NOTES:

1. VCC = 2V, TA = +25°C, and is not production tested.

2. tRC = Read Cycle Time.

3. This parameter is guaranteed by device characterization but not production tested.