Analog Integrated Circuit Device Data

6

Freescale Semiconductor

33800

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

ELECTRICAL CHARACTERISTICS

MAXIMUM RATINGS

Table 2. Maximum Ratings

All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or

permanent damage to the device.

Ratings

Symbol

Value

Unit

ELECTRICAL RATINGS

Supply Voltage

-1.5 to 45

-0.3 to 7.0

CS,

SI, SO, SCLK, EN, DEFAULT, PWMx, P1, P3, P5, P7

–

Predriver Drain Voltage (VDSNS1 to VDSNS6)

-0.3 to 60

OSS Output Clamp Energy (OUT3 to OUT8)(Single Pulse)

30

mJ

OSS Output Clamp Energy (OUT1 & OUT2)(Single Pulse)

45

mJ

CCD1 Output Clamp Energy (Single Pulse)

75

mJ

CCD2 Output Clamp Energy (Single Pulse)

25

mJ

OSS Output Continuous Current (OUT1 to OUT8 Steady State)

350

mA

CCD1 Output Clamp Energy (CCD1_REC OUTPUT)

75

mJ

(3)

–

4.0

MHz

ESD Voltage(1)

Human Body Model

Machine Model

±2000

±200

V

THERMAL RATINGS

Storage Temperature

-55 to 150

Operating Case Temperature

-40 to 125

Operating Junction Temperature

-40 to 150

(2)

1.7

W

THERMAL RESISTANCE

Thermal Resistance

Junction to Ambient

Between the Die and the Exposed Die Pad

71

1.2

Notes

1.

ESD data available upon request. All pins tested individually. ESD1 testing is performed in accordance with the Human Body Model

(AEC-Q100-002). and the Machine Model (AEC-Q100-003).

2.

3.

This parameter is guaranteed by design but is not production tested.