SN54ABT8543, SN74ABT8543

SCAN TEST DEVICES WITH

OCTAL REGISTERED BUS TRANSCEIVERS

SCBS120E – AUGUST 1991 – REVISED JULY 1996

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POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

D Members of the Texas Instruments

SCOPE

™ Family of Testability Products

D Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

D Functionally Equivalent to ’F543 and

’ABT543 in the Normal-Function Mode

D SCOPE ™ Instruction Set

– IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP,

and HIGHZ

– Parallel-Signature Analysis at Inputs

With Masking Option

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Even-Parity Opcodes

D Two Boundary-Scan Cells Per I/O for

Greater Flexibility

D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design

Significantly Reduces Power Dissipation

D Package Options Include Plastic

Small-Outline (DW) and Shrink

Small-Outline (DL) Packages, Ceramic Chip

Carriers (FK), and Standard Ceramic

DIPs (JT)

description

The ’ABT8543 scan test devices with octal

registered bus transceivers are members of the

Texas

Instruments

SCOPE

™

testability

integrated-circuit family. This family of devices

supports IEEE Standard 1149.1-1990 boundary

scan to facilitate testing of complex circuit-board

assemblies. Scan access to the test circuitry is

accomplished via the 4-wire test access port

(TAP) interface.

In the normal mode, these devices are functionally equivalent to the ’F543 and ’ABT543 octal registered bus

transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at

the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not

affect the functional operation of the SCOPE

™ octal registered bus transceivers.

Copyright

© 1996, Texas Instruments Incorporated

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE and EPIC-

ΙΙB are trademarks of Texas Instruments Incorporated.

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LEAB

CEAB

OEAB

A1

A2

A3

GND

A4

A5

A6

A7

A8

TDO

TMS

LEBA

CEBA

OEBA

B1

B2

B3

B4

VCC

B5

B6

B7

B8

TDI

TCK

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B7

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TDI

TCK

TMS

TDO

A8

OEBA

CEBA

LEBA

LEAB

CEAB

OEAB

A1

4

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SN54ABT8543 . . . JT PACKAGE

SN74ABT8543 . . . DL OR DW PACKAGE

(TOP VIEW)

SN54ABT8543 . . . FK PACKAGE

(TOP VIEW)