LM95245

SNIS148G – OCTOBER 2007 – REVISED MARCH 2013

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Logic Electrical Characteristics

Digital DC Characteristics

Unless otherwise noted, these specifications apply for VDD= +3.0 Vdc to 3.6 Vdc. Boldface limits apply for TA = TJ = TMIN to

TMAX; all other limits TA= TJ= +25°C, unless otherwise noted.

Unit

Parameter

Test Conditions

Typ(1)

Limits(2)

(Limit)

SMBDAT, SMBCLK INPUTS

VIN(1)

Logical “1” Input Voltage

2.1

V (min)

VIN(0)

Logical “0” Input Voltage

0.8

V (max)

VIN(HYST)

SMBDAT and SMBCLK Digital Input

400

mV

Hysteresis

IIN(1)

Logical “1” Input Current

VIN = VDD

−0.005

−10

µA (max)

IIN(0)

Logical “0” Input Current

VIN = 0 V

0.005

+10

µA (max)

CIN

Input Capacitance

5

pF

A0 DIGITAL INPUT

VIH

Input High Voltage

0.90 × VDD

V (min)

0.57 × VDD

V (max)

VIM

Input Middle Voltage

0.43 × VDD

V (min)

VIL

Input Low Voltage

0.10 × VDD

V (max)

IIN(1)

Logical “1” Input Current

VIN = VDD

−0.005

−10

µA (max)

IIN(0)

Logical “0” Input Current

VIN = 0 V

0.005

+10

µA (max)

CIN

Input Capacitance

5

pF

SMBDAT, T_CRIT, OS DIGITAL OUTPUTS

IOH

High Level Output Leakage Current

VOUT = VDD

10

µA (max)

VOL(T_CRIT, OS)

T_CRIT, OS Low Level Output Voltage

IOL = 6 mA

0.4

V (max)

IOL = 4 mA

0.4

V (max)

VOL(SMBDAT)

SMBDAT Low Level Output Voltage

IOL = 6 mA

0.6

V (max)

COUT

Digital Output Capacitance

5

pF

(1)

Typical figures are at TA = 25°C and represent most likely parametric norms at the time of product characterization. The typical

specifications are not guaranteed.

(2)

Limits are guaranteed to TI's AOQL (Average Outgoing Quality Level).

6

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