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TCA9803 Datasheet(PDF) 14 Page - Texas Instruments

Part # TCA9803
Description  TCA9803 Level-Translating I2C Bus Buffer/Repeater
PDF  38 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

TCA9803 Datasheet(HTML) 14 Page - Texas Instruments

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VCCB
A-Side
B-Side
ICS
TCA980x
I
2C Slave
PD
OL
OL
R
V
/ I
14
TCA9803
SCPS267B – MARCH 2017 – REVISED FEBRUARY 2020
www.ti.com
Product Folder Links: TCA9803
Submit Documentation Feedback
Copyright © 2017–2020, Texas Instruments Incorporated
9.4.1.1.2
RILC
The RILC parameter describes the maximum allowed pull-down resistance. This parameter comes from the
combination of IILC and ICS, and states the maximum resistance that can satisfy the IILC parameter. Note that
series resistors on the bus are going to affect this, as seen with other types of buffers (voltage delta across the
series resistor. This increases the effective VOL of the external device pulling the bus low).
The calculated resistance of the internal pull-down FET of an external device can be calculated from the VOL and
IOL measurements of the external device in question using Equation 1. Take care to consider any series resistors
placed in the path from the TCA980x to any external device. Note that RPD is the calculated resistance of the
internal pull-down FET, and not a resistor to ground. This is for determining if the external device's output
characteristics meet the TCA980x RILC requirement (150 Ω).
(1)
9.4.1.2 Input and Output Leakage Current (IEXT-I/IEXT-O)
The Input external current (IEXT-I) and output external current (IEXT-O) parameters describe the amount of parasitic
current either injected into the device or pulled from the device (such as leakage from ESD cells) without
affecting device operation as shown in Table 4.
Table 4. B-Side Input and Output Leakage Current
PARAMETER
SHORT DESCRIPTION
DETAILED
INFORMATION
IEXT-I
Input leakage current
Current that is external, but pulled up to supply, leaking current into the TCA980x
B-side. An example is a leaky ESD cell from VCC, or an external pull-up resistor.
See the IEXT-I
section
IEXT-O
Output leakage current
Current that is pulled from the TCA980x B-side. ESD cells are the most common
form of output leakage. Care must be taken not to violate this spec, otherwise the
leakage current can create a false low.
See the IEXT-O
section
9.4.1.2.1
IEXT-I
IEXT-I is a current source that is external to the TCA980x B-side, but leaks current into the device. This type of
input leakage may not exceed the IEXT-I maximum spec, or else the minimum IILC value does not apply.
Figure 13. IEXT-I Example
As shown in Figure 13, IEXT-I is a source of additional current into the device, shown as a leaky ESD cell. The
user must keep IEXT-I as close to 0 as possible, since the TCA980x has a current source as a pull-up internally,
and uses this current source to help detect which side is driving a low. As IEXT-I increases, it increases the
minimum IILC value, requiring that an external device sink more current from the TCA980x in order to transmit a
low. There must be no external pull-up resistor on the B-side to contribute to IEXT-I.



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