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VNH2SP30-E Datasheet(PDF) 12 Page - STMicroelectronics |
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VNH2SP30-E Datasheet(HTML) 12 Page - STMicroelectronics |
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12 / 35 page ![]() Electrical specifications VNH2SP30-E 12/35 DocID10832 Rev 10 Figure 4. Definition of the delay times measurement Table 11. Current sense (9 V < VCC < 16 V) Symbol Parameter Test conditions Min Typ Max Unit K1 IOUT/ISENSE IOUT = 30A; RSENSE = 1.5k; Tj = -40 to 150°C 9665 11370 13075 K2 IOUT/ISENSE IOUT = 8A; RSENSE = 1.5k; Tj = -40 to 150°C 9096 11370 13644 dK1 / K1(1) 1. Analog sense current drift is deviation of factor K for a given device over (-40 °C to 150 °C and 9 V < VCC < 16 V) with respect to its value measured at Tj = 25°C, VCC = 13 V. Analog sense current drift IOUT = 30A; RSENSE = 1.5k; Tj = -40 to 150°C -8 +8 % dK2 / K2(1) Analog sense current drift IOUT > 8A; RSENSE = 1.5k; Tj = -40 to 150°C -10 +10 ISENSEO Analog sense leakage current IOUT = 0A; VSENSE = 0V; Tj = -40 to 150°C 065 µA t t VINB VINA t PWM t ILOAD tDEL tDEL |
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