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KSC5026MOS Datasheet(PDF) 3 Page - ON Semiconductor |
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KSC5026MOS Datasheet(HTML) 3 Page - ON Semiconductor |
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3 / 7 page ![]() © 2011 Fairchild Semiconductor Corporation www.fairchildsemi.com KSC5026M Rev. B3 2 Electrical Characteristics T A = 25°C unless otherwise noted hFE Classification Symbol Parameter Test Condition Min. Typ. Max. Units BVCBO Collector-Base Breakdown Voltage IC = 1mA, IE = 0 1100 V BVCEO Collector-Emitter Breakdown Voltage IC = 5mA, IB = 0 800 V BVEBO Emitter-Base Breakdown Voltage IE = 1mA, IC = 0 7 V VCEX(sus) Collector-Emitter Sustaining Voltage IC = 0.75A, IB1 = -IB2 = 0.15A, L = 5mH, Clamped 800 V ICBO Collector Cut-off Current VCB = 800V, IE = 0 10 μA IEBO Emitter Cut-off Current VEB = 5V, IC = 0 10 μA hFE1 hFE2 DC Current Gain VCE = 5V, IC = 0.1A VCE = 5V, IC = 0.5A 10 8 40 VCE(sat) Collector-Emitter Saturation Voltage IC = 0.75A, IB = 0.15A 2 V VBE(sat) Base-Emitter Saturation Voltage IC = 0.75A, IB = 0.15A 1.5 V Cob Output Capacitance VCB = 10V, IE = 0, f = 1MHz 35 pF fT Current Gain Bandwidth Product VCE = 10V, IC = 0.1A 15 MHz tON Turn On Time VCC = 400V IC = 5IB1 = -2.5IB2 = 1A RL = 400Ω 0.5 μs tSTG Storage Time 3 μs tF Fall Time 0.3 μs Classification N R O hFE1 10 ~ 20 15 ~ 30 20 ~ 40 |
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