CAT5261

Doc. No. MD-2122 Rev. E

6

© Catalyst Semiconductor, Inc.

Characteristics subject to change without notice

POWER UP TIMING

(1)(2)

Symbol

Parameter

Max

Units

Power-up to Read Operation

1

ms

Power-up to Write Operation

1

ms

XDCP TIMING

Symbol

Parameter

Min

Max

Units

Wiper Response Time After Power Supply Stable

5

10

µs

Wiper Response Time After Instruction Issued

5

10

µs

WRITE CYCLE LIMITS

Symbol

Parameter

Max

Units

Write Cycle Time

5

ms

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Reference Test Method

Min

Max

Units

(3)

Endurance

MIL-STD-883, Test Method 1033

1,000,000

Cycles/Byte

(3)

Data Retention

MIL-STD-883, Test Method 1008

100

Years

(3)

ESD Susceptibility

MIL-STD-883, Test Method 3015

2000

V

(3)

Latch-Up

JEDEC Standard 17

100

mA

Notes:

(1) This parameter is tested initially and after a design or process change that affects the parameter.

(3) This parameter is tested initially and after a design or process change that affects the parameter.

Figure 1. Synchronous Data Timing

Note: Dashed Line = mode (1, 1)

VALID IN

VIL

HI-Z

HI-Z

CS

SCK

SI

SO

tFI