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SN28837FS Datasheet(PDF) 4 Page - Texas Instruments |
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SN28837FS Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 18 page ![]() SN28837 1/2-INCH PAL TIMER SOCS031B – JULY 1991 4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 Terminal Functions (Continued) TERMINAL I/O DESCRIPTION NAME NO. I/O DESCRIPTION SFI 14 O Second field index SH1 51 O Sample and hold 1 S1 32 O Serial clock 1 S2 33 O Serial clock 2 S3 34 O Serial clock 3 T 31 O Transfer-gate clock TESTA 12 O Test A (factory-test point) TESTB 16 O Test B (factory-test point) TESTC 17 O Test C (factory-test point) VCC 24, 40, 45 DC power VCC1 44 Oscillator power VCR 58 I Vertical-counter reset VD 8 O Vertical drive VDS 18 I Vertical-dump speed. When VDS is high, the vertical-dump frequency is 3.3 MHz; when VDS is low, the vertical-dump frequency is 2 MHz. VD2 28 O Real-display-area signal. VD2 is a test point and is not used in normal operation. VGATE 20 O Decoded V count signal. VGATE is a test point and is not used in normal operation. X1 42 Crystal oscillator (see Figure 2) X2 43 Crystal oscillator (see Figure 2) 12 3 tint Flush Pulses Transfer Pulse GP Figure 1. GP Flush and Transfer Pulses |
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